{"title":"基于mwm阵列的无损检测应用中,采用自适应测量范围控制的片上电感阻抗测量方法","authors":"Yulong Shi, Degang Chen","doi":"10.1109/MWSCAS.2012.6292096","DOIUrl":null,"url":null,"abstract":"Motivated by emerging meandering winding magnetometer (MWM) array based Non-Destructive Evaluation (NDE) applications, this paper presents a new approach for on-chip inductive impedance measurement to enable MWM-array applications to be happened in field, in real-time, and during targets' operation. Different from state of art solutions which rely on high precision analog processing functions to achieve high accuracy, the proposed approach innovatively incorporate bridge circuit, feedback, and resonance concepts to achieve impedance measurement on a single chip. Behavior level simulation demonstrated the measurement algorithm and feasibility of the proposed method.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"177 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An on-chip inductive impedance measurement method with adaptive measurement range control for MWM-array based NDE applications\",\"authors\":\"Yulong Shi, Degang Chen\",\"doi\":\"10.1109/MWSCAS.2012.6292096\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Motivated by emerging meandering winding magnetometer (MWM) array based Non-Destructive Evaluation (NDE) applications, this paper presents a new approach for on-chip inductive impedance measurement to enable MWM-array applications to be happened in field, in real-time, and during targets' operation. Different from state of art solutions which rely on high precision analog processing functions to achieve high accuracy, the proposed approach innovatively incorporate bridge circuit, feedback, and resonance concepts to achieve impedance measurement on a single chip. Behavior level simulation demonstrated the measurement algorithm and feasibility of the proposed method.\",\"PeriodicalId\":324891,\"journal\":{\"name\":\"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"volume\":\"177 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-09-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2012.6292096\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2012.6292096","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An on-chip inductive impedance measurement method with adaptive measurement range control for MWM-array based NDE applications
Motivated by emerging meandering winding magnetometer (MWM) array based Non-Destructive Evaluation (NDE) applications, this paper presents a new approach for on-chip inductive impedance measurement to enable MWM-array applications to be happened in field, in real-time, and during targets' operation. Different from state of art solutions which rely on high precision analog processing functions to achieve high accuracy, the proposed approach innovatively incorporate bridge circuit, feedback, and resonance concepts to achieve impedance measurement on a single chip. Behavior level simulation demonstrated the measurement algorithm and feasibility of the proposed method.