基于mwm阵列的无损检测应用中,采用自适应测量范围控制的片上电感阻抗测量方法

Yulong Shi, Degang Chen
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引用次数: 1

摘要

基于弯曲绕组磁强计(MWM)阵列的无损检测(NDE)应用,提出了一种新的片上电感阻抗测量方法,使MWM阵列的应用能够在现场、实时和目标运行过程中进行。与依靠高精度模拟处理功能来实现高精度的解决方案不同,该方法创新性地结合了桥式电路、反馈和谐振概念,在单个芯片上实现阻抗测量。行为级仿真验证了测量算法和所提方法的可行性。
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An on-chip inductive impedance measurement method with adaptive measurement range control for MWM-array based NDE applications
Motivated by emerging meandering winding magnetometer (MWM) array based Non-Destructive Evaluation (NDE) applications, this paper presents a new approach for on-chip inductive impedance measurement to enable MWM-array applications to be happened in field, in real-time, and during targets' operation. Different from state of art solutions which rely on high precision analog processing functions to achieve high accuracy, the proposed approach innovatively incorporate bridge circuit, feedback, and resonance concepts to achieve impedance measurement on a single chip. Behavior level simulation demonstrated the measurement algorithm and feasibility of the proposed method.
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