基于CMOS技术的单、双交叉电极(IDT)结构SAW谐振器有限元建模

Aliza Aini Md Ralib, A. Nordin, U. Hashim
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引用次数: 6

摘要

介绍了单电极和双电极(IDT)结构的CMOS表面声波谐振器的性能。表面声波谐振器中的交错电极结构是表面声波器件激发的关键部件。IDT的可能配置有单电极和双电极。在0.5 GHz ~ 1ghz频率范围内,比较了单电极谐振器和双电极谐振器的性能。利用COMSOL Multiphysics®对CMOS SAW谐振器的二维有限元建模进行了三步分析,包括本征频率、频域和时域分析。器件的结构和尺寸基于0.18 μm RF CMOS工艺,其中IDT图案采用标准CMOS工艺制作。仿真结果表明,双电极CMOS SAW谐振器的质量因数比单电极CMOS SAW谐振器高几千倍。
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Finite element modeling of SAW resonator in CMOS technology for single and double interdigitated electrode (IDT) structure
The performance of surface acoustic wave resonator in CMOS technology for single and double electrode (IDT) structure is presented. Interdigitated electrodes (IDT) structure in surface acoustic wave (SAW) resonator is the most crucial component for excitation of SAW devices. Possible configurations for the IDT are single electrode and double electrode. The performance of the resonator for single and double electrode is compared at a frequency range of 0.5 GHz to 1 GHz. 2D Finite element modeling of the CMOS SAW resonator was simulated using COMSOL Multiphysics® for three step analysis eigen frequency, frequency domain and time domain analysis. The structure and dimension of the device is based on 0.18 μm RF CMOS process where the pattern of IDT is fabricated using standard CMOS fabrication process. The simulated results shows high quality factor in the order of thousands for double electrode CMOS SAW resonator compared to single electrode CMOS SAW resonator.
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