{"title":"硅光子可重构加/丢复用器的自动测试","authors":"M. Petrini, Rita Baldi, F. Morichetti, A. Melloni","doi":"10.1109/SUM53465.2022.9858270","DOIUrl":null,"url":null,"abstract":"A novel method to perform both electrical and optical testing of Photonic Circuit is presented. The use of probe card to electrically access and characterize the device enables the execution of a new approach for the calibration and cloning of filter-based devices.","PeriodicalId":371464,"journal":{"name":"2022 IEEE Photonics Society Summer Topicals Meeting Series (SUM)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Automatic Testing of a Silicon Photonic Reconfigurable Add/Drop Multiplexer\",\"authors\":\"M. Petrini, Rita Baldi, F. Morichetti, A. Melloni\",\"doi\":\"10.1109/SUM53465.2022.9858270\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel method to perform both electrical and optical testing of Photonic Circuit is presented. The use of probe card to electrically access and characterize the device enables the execution of a new approach for the calibration and cloning of filter-based devices.\",\"PeriodicalId\":371464,\"journal\":{\"name\":\"2022 IEEE Photonics Society Summer Topicals Meeting Series (SUM)\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Photonics Society Summer Topicals Meeting Series (SUM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SUM53465.2022.9858270\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Photonics Society Summer Topicals Meeting Series (SUM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SUM53465.2022.9858270","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automatic Testing of a Silicon Photonic Reconfigurable Add/Drop Multiplexer
A novel method to perform both electrical and optical testing of Photonic Circuit is presented. The use of probe card to electrically access and characterize the device enables the execution of a new approach for the calibration and cloning of filter-based devices.
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