{"title":"具有成本效益的生产DC/RF晶圆上GaAs场效应管测量系统","authors":"Eric S. Copeland, Matthew M. Borg, K. Kerwin","doi":"10.1109/ARFTG.1989.323964","DOIUrl":null,"url":null,"abstract":"This paper describes a cost-effective DC and microwave test system for production screening of discrete and process-monitor GaAs FETs. Topics covered include system hardware, test software and data storage, DC error-correction, RF GaAs FET modeling, RF probe card technology, error-correction for common-mode inductance, and on-wafer calibration.","PeriodicalId":153615,"journal":{"name":"34th ARFTG Conference Digest","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Cost-Effective Production DC/RF On-Wafer GaAs FET Measurement System\",\"authors\":\"Eric S. Copeland, Matthew M. Borg, K. Kerwin\",\"doi\":\"10.1109/ARFTG.1989.323964\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a cost-effective DC and microwave test system for production screening of discrete and process-monitor GaAs FETs. Topics covered include system hardware, test software and data storage, DC error-correction, RF GaAs FET modeling, RF probe card technology, error-correction for common-mode inductance, and on-wafer calibration.\",\"PeriodicalId\":153615,\"journal\":{\"name\":\"34th ARFTG Conference Digest\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"34th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1989.323964\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"34th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1989.323964","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Cost-Effective Production DC/RF On-Wafer GaAs FET Measurement System
This paper describes a cost-effective DC and microwave test system for production screening of discrete and process-monitor GaAs FETs. Topics covered include system hardware, test software and data storage, DC error-correction, RF GaAs FET modeling, RF probe card technology, error-correction for common-mode inductance, and on-wafer calibration.
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