基于加权字典学习的热场重构

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Circuits Devices & Systems Pub Date : 2021-09-16 DOI:10.1049/cds2.12098
Tianyi Zhang, Wenchang Li, Jinyu Xiao, Jian Liu
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引用次数: 0

摘要

动态热管理(DTM)用于解决高性能超大规模集成芯片的热问题。虚警率(FAR)可以用来评价全片热场重构精度对DTM的影响。低FAR依赖于完整热场的精确重建,特别是在DTM的温度触发阈值附近。然而,目前很少有人关注这样的温度范围。为了降低误码率,提出了一种新的全芯片热场重构策略。采用低维线性模型精确地表示热场。利用字典学习技术对模型进行训练,并采用最小加权均方误差评价方法提高温度触发阈值附近的重建精度。提出了一种利用启发式算法解决np困难问题的温度传感器放置算法。实验结果表明,与现有方法相比,该方法可以在触发阈值附近以更精确的精度重建整个热场,并实现最低的FAR。
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Thermal field reconstruction based on weighted dictionary learning

Dynamic thermal management (DTM) is applied to address the thermal problem of high performance very-large-scale integrated chips. The false alarm rate (FAR) can be used to evaluate the impact of full-chip thermal field reconstruction accuracy on DTM. A low FAR relies on the accurate reconstruction of the full thermal field, especially near the temperature triggering threshold of DTM. However, little attention is currently being paid to such temperature ranges. To reduce FAR, a new full-chip thermal field reconstruction strategy is proposed. A low-dimensional linear model is used to accurately represent the thermal fields. The dictionary learning technology is exploited to train the model and the minimum weighted mean square error evaluation method is incorporated to improve the reconstruction accuracy near the temperature triggering threshold. A temperature sensor placement algorithm using the heuristic algorithm to solve the NP-hard problem is also proposed. The experimental results show that the proposed strategy can reconstruct the full thermal field with a more precise accuracy near the triggering threshold and achieve the lowest FAR compared to the state of the art.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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