{"title":"在装有白光共聚焦探头的非视觉三坐标测量机上测量线标度和栅格板","authors":"John Horwell","doi":"10.51843/wsproceedings.2013.47","DOIUrl":null,"url":null,"abstract":"To explore the technical feasibility of measuring and certifying Glass Line Scales and Grid Plates on a high accuracy CMM with an integrated chromatic confocal sensor. These white light confocal sensors do not rely on back lighting, are not capable of capturing 1000’s of data points on a measured line, and have no image cleaning capability. What they do offer is a system that can calibrate artifacts up to 1000mm in length with a very low uncertainty using a measurement technique quite different than normal optical sensors.","PeriodicalId":445779,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2013","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Measuring Line Scales and Grid Plates on a Non-Vision CMM equipped with a White Light Confocal Probe\",\"authors\":\"John Horwell\",\"doi\":\"10.51843/wsproceedings.2013.47\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To explore the technical feasibility of measuring and certifying Glass Line Scales and Grid Plates on a high accuracy CMM with an integrated chromatic confocal sensor. These white light confocal sensors do not rely on back lighting, are not capable of capturing 1000’s of data points on a measured line, and have no image cleaning capability. What they do offer is a system that can calibrate artifacts up to 1000mm in length with a very low uncertainty using a measurement technique quite different than normal optical sensors.\",\"PeriodicalId\":445779,\"journal\":{\"name\":\"NCSL International Workshop & Symposium Conference Proceedings 2013\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"NCSL International Workshop & Symposium Conference Proceedings 2013\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.51843/wsproceedings.2013.47\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"NCSL International Workshop & Symposium Conference Proceedings 2013","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.51843/wsproceedings.2013.47","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measuring Line Scales and Grid Plates on a Non-Vision CMM equipped with a White Light Confocal Probe
To explore the technical feasibility of measuring and certifying Glass Line Scales and Grid Plates on a high accuracy CMM with an integrated chromatic confocal sensor. These white light confocal sensors do not rely on back lighting, are not capable of capturing 1000’s of data points on a measured line, and have no image cleaning capability. What they do offer is a system that can calibrate artifacts up to 1000mm in length with a very low uncertainty using a measurement technique quite different than normal optical sensors.