M. Graziano, M. Delaurenti, G. Masera, G. Piccinini, M. Zamboni
{"title":"噪音安全设计方法","authors":"M. Graziano, M. Delaurenti, G. Masera, G. Piccinini, M. Zamboni","doi":"10.1109/ISQED.2000.838869","DOIUrl":null,"url":null,"abstract":"The increasing densities in growing size circuits leads us to consider as an issue noise problems such as crosstalk, switching noise, electromigration and substrate injection. Noise safety must be a clear objective in design tools, whose development must then include circuit models for the analysis of noise phenomena. This paper points out a proposed methodology in the development of new models and related tools that focus on the noise immunity of circuit design.","PeriodicalId":113766,"journal":{"name":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Noise safety design methodologies\",\"authors\":\"M. Graziano, M. Delaurenti, G. Masera, G. Piccinini, M. Zamboni\",\"doi\":\"10.1109/ISQED.2000.838869\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The increasing densities in growing size circuits leads us to consider as an issue noise problems such as crosstalk, switching noise, electromigration and substrate injection. Noise safety must be a clear objective in design tools, whose development must then include circuit models for the analysis of noise phenomena. This paper points out a proposed methodology in the development of new models and related tools that focus on the noise immunity of circuit design.\",\"PeriodicalId\":113766,\"journal\":{\"name\":\"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-03-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2000.838869\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2000.838869","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The increasing densities in growing size circuits leads us to consider as an issue noise problems such as crosstalk, switching noise, electromigration and substrate injection. Noise safety must be a clear objective in design tools, whose development must then include circuit models for the analysis of noise phenomena. This paper points out a proposed methodology in the development of new models and related tools that focus on the noise immunity of circuit design.