{"title":"使用基于VXI的面包板模块","authors":"B. Wright","doi":"10.1109/AUTEST.1997.633632","DOIUrl":null,"url":null,"abstract":"Plug-in VXI based breadboard modules are an excellent solution to achieve a lower costing, time and hardware saving test bench. These breadboard modules are equipped with built-in VXI bus interface circuitry and a breadboard area for creating a design to suit your test needs. A prime example for the use of this capability was demonstrated on a recent radar system test bench created to test many unique Units Under Test (UUTs) previously tested on separate test benches. A single breadboard module design replaced the dedicated interface and control hardware within the many test benches and test fixtures previously used to test the individual UUTs. This paper will present some design considerations and techniques implemented as part of this VXI breadboard module that can be useful when creating a VXI breadboard design. If will also address the inherent built-in test capabilities provided by the module in conjunction with the techniques presented in the paper.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Using VXI based breadboard modules\",\"authors\":\"B. Wright\",\"doi\":\"10.1109/AUTEST.1997.633632\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Plug-in VXI based breadboard modules are an excellent solution to achieve a lower costing, time and hardware saving test bench. These breadboard modules are equipped with built-in VXI bus interface circuitry and a breadboard area for creating a design to suit your test needs. A prime example for the use of this capability was demonstrated on a recent radar system test bench created to test many unique Units Under Test (UUTs) previously tested on separate test benches. A single breadboard module design replaced the dedicated interface and control hardware within the many test benches and test fixtures previously used to test the individual UUTs. This paper will present some design considerations and techniques implemented as part of this VXI breadboard module that can be useful when creating a VXI breadboard design. If will also address the inherent built-in test capabilities provided by the module in conjunction with the techniques presented in the paper.\",\"PeriodicalId\":369132,\"journal\":{\"name\":\"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-09-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1997.633632\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1997.633632","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Plug-in VXI based breadboard modules are an excellent solution to achieve a lower costing, time and hardware saving test bench. These breadboard modules are equipped with built-in VXI bus interface circuitry and a breadboard area for creating a design to suit your test needs. A prime example for the use of this capability was demonstrated on a recent radar system test bench created to test many unique Units Under Test (UUTs) previously tested on separate test benches. A single breadboard module design replaced the dedicated interface and control hardware within the many test benches and test fixtures previously used to test the individual UUTs. This paper will present some design considerations and techniques implemented as part of this VXI breadboard module that can be useful when creating a VXI breadboard design. If will also address the inherent built-in test capabilities provided by the module in conjunction with the techniques presented in the paper.