{"title":"一种评估存在无功寄生元件时模拟电路稳定性的仿真技术","authors":"S.C. Wong, Y.S. Lee, C. Tse, M. Chow","doi":"10.1109/TENCON.1995.496363","DOIUrl":null,"url":null,"abstract":"A simple simulation method that evaluates the stability of analog circuits in the presence of reactive parasitic elements is proposed. This method also gives the range of values and the exact locations of the parasitic elements for which a given stable circuit will be rendered oscillatory.","PeriodicalId":425138,"journal":{"name":"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A simulation technique for evaluating analog circuits stability in the presence of reactive parasitic elements\",\"authors\":\"S.C. Wong, Y.S. Lee, C. Tse, M. Chow\",\"doi\":\"10.1109/TENCON.1995.496363\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A simple simulation method that evaluates the stability of analog circuits in the presence of reactive parasitic elements is proposed. This method also gives the range of values and the exact locations of the parasitic elements for which a given stable circuit will be rendered oscillatory.\",\"PeriodicalId\":425138,\"journal\":{\"name\":\"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TENCON.1995.496363\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.1995.496363","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A simulation technique for evaluating analog circuits stability in the presence of reactive parasitic elements
A simple simulation method that evaluates the stability of analog circuits in the presence of reactive parasitic elements is proposed. This method also gives the range of values and the exact locations of the parasitic elements for which a given stable circuit will be rendered oscillatory.
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