{"title":"晶体振荡器和SAW振荡器相位抖动测量轮循结果的中期报告","authors":"M. Koyama, T. Hosoda, T. Uchiyama","doi":"10.1109/FREQ.2006.275390","DOIUrl":null,"url":null,"abstract":"In this paper, progress of the domestic (Japan) round robin phase jitter measurement of quartz crystal oscillators and SAW oscillators is explained. Users apply the SONET/SDH analyzer to measure the phase jitter of quartz crystal oscillators and SAW oscillators, which is currently in demand. The SONET/SDH analyzer was chosen as the measurement device with the intention of establishing an international standard. This paper attempts to display the process of international standardization, with reference to the progress of the domestic round robin measurement of quartz crystal oscillators and SAW oscillators. The occurrence of measurement errors, and the values demanded by the users that could not be guaranteed were shown","PeriodicalId":445945,"journal":{"name":"2006 IEEE International Frequency Control Symposium and Exposition","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Interim report on the round robin result of phase jitter measurement in crystal oscillators and SAW oscillators\",\"authors\":\"M. Koyama, T. Hosoda, T. Uchiyama\",\"doi\":\"10.1109/FREQ.2006.275390\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, progress of the domestic (Japan) round robin phase jitter measurement of quartz crystal oscillators and SAW oscillators is explained. Users apply the SONET/SDH analyzer to measure the phase jitter of quartz crystal oscillators and SAW oscillators, which is currently in demand. The SONET/SDH analyzer was chosen as the measurement device with the intention of establishing an international standard. This paper attempts to display the process of international standardization, with reference to the progress of the domestic round robin measurement of quartz crystal oscillators and SAW oscillators. The occurrence of measurement errors, and the values demanded by the users that could not be guaranteed were shown\",\"PeriodicalId\":445945,\"journal\":{\"name\":\"2006 IEEE International Frequency Control Symposium and Exposition\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 IEEE International Frequency Control Symposium and Exposition\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FREQ.2006.275390\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Frequency Control Symposium and Exposition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.2006.275390","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Interim report on the round robin result of phase jitter measurement in crystal oscillators and SAW oscillators
In this paper, progress of the domestic (Japan) round robin phase jitter measurement of quartz crystal oscillators and SAW oscillators is explained. Users apply the SONET/SDH analyzer to measure the phase jitter of quartz crystal oscillators and SAW oscillators, which is currently in demand. The SONET/SDH analyzer was chosen as the measurement device with the intention of establishing an international standard. This paper attempts to display the process of international standardization, with reference to the progress of the domestic round robin measurement of quartz crystal oscillators and SAW oscillators. The occurrence of measurement errors, and the values demanded by the users that could not be guaranteed were shown