RISC-V处理器的可测试性、安全性和保密性研究进展综述

J. Anders, Pablo Andreu, B. Becker, S. Becker, R. Cantoro, N. I. Deligiannis, N. Elhamawy, Tobias Faller, Carles Hernández, N. Mentens, Mahnaz Namazi Rizi, I. Polian, Abolfazl Sajadi, Mathias Sauer, Denis Schwachhofer, M. Reorda, T. Stefanov, I. Tuzov, S. Wagner, N. Zidarič
{"title":"RISC-V处理器的可测试性、安全性和保密性研究进展综述","authors":"J. Anders, Pablo Andreu, B. Becker, S. Becker, R. Cantoro, N. I. Deligiannis, N. Elhamawy, Tobias Faller, Carles Hernández, N. Mentens, Mahnaz Namazi Rizi, I. Polian, Abolfazl Sajadi, Mathias Sauer, Denis Schwachhofer, M. Reorda, T. Stefanov, I. Tuzov, S. Wagner, N. Zidarič","doi":"10.1109/ETS56758.2023.10174099","DOIUrl":null,"url":null,"abstract":"With the continued success of the open RISC-V architecture, practical deployment of RISC-V processors necessitates an in-depth consideration of their testability, safety and security aspects. This survey provides an overview of recent developments in this quickly-evolving field. We start with discussing the application of state-of-the-art functional and system-level test solutions to RISC-V processors. Then, we discuss the use of RISC-V processors for safety-related applications; to this end, we outline the essential techniques necessary to obtain safety both in the functional and in the timing domain and review recent processor designs with safety features. Finally, we survey the different aspects of security with respect to RISC-V implementations and discuss the relationship between cryptographic protocols and primitives on the one hand and the RISC-V processor architecture and hardware implementation on the other. We also comment on the role of a RISC-V processor for system security and its resilience against side-channel attacks.","PeriodicalId":211522,"journal":{"name":"2023 IEEE European Test Symposium (ETS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors\",\"authors\":\"J. Anders, Pablo Andreu, B. Becker, S. Becker, R. Cantoro, N. I. Deligiannis, N. Elhamawy, Tobias Faller, Carles Hernández, N. Mentens, Mahnaz Namazi Rizi, I. Polian, Abolfazl Sajadi, Mathias Sauer, Denis Schwachhofer, M. Reorda, T. Stefanov, I. Tuzov, S. Wagner, N. Zidarič\",\"doi\":\"10.1109/ETS56758.2023.10174099\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the continued success of the open RISC-V architecture, practical deployment of RISC-V processors necessitates an in-depth consideration of their testability, safety and security aspects. This survey provides an overview of recent developments in this quickly-evolving field. We start with discussing the application of state-of-the-art functional and system-level test solutions to RISC-V processors. Then, we discuss the use of RISC-V processors for safety-related applications; to this end, we outline the essential techniques necessary to obtain safety both in the functional and in the timing domain and review recent processor designs with safety features. Finally, we survey the different aspects of security with respect to RISC-V implementations and discuss the relationship between cryptographic protocols and primitives on the one hand and the RISC-V processor architecture and hardware implementation on the other. We also comment on the role of a RISC-V processor for system security and its resilience against side-channel attacks.\",\"PeriodicalId\":211522,\"journal\":{\"name\":\"2023 IEEE European Test Symposium (ETS)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS56758.2023.10174099\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS56758.2023.10174099","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

随着开放式RISC-V架构的持续成功,RISC-V处理器的实际部署需要深入考虑其可测试性、安全性和安全性方面的问题。这个调查概述了这个快速发展的领域的最新发展。我们首先讨论最先进的功能和系统级测试解决方案在RISC-V处理器中的应用。然后,我们讨论了RISC-V处理器在安全相关应用中的使用;为此,我们概述了在功能和时序领域获得安全性所必需的基本技术,并回顾了最近具有安全特性的处理器设计。最后,我们调查了与RISC-V实现相关的安全性的不同方面,并讨论了加密协议和原语与RISC-V处理器架构和硬件实现之间的关系。我们还评论了RISC-V处理器对系统安全性的作用及其对侧信道攻击的弹性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors
With the continued success of the open RISC-V architecture, practical deployment of RISC-V processors necessitates an in-depth consideration of their testability, safety and security aspects. This survey provides an overview of recent developments in this quickly-evolving field. We start with discussing the application of state-of-the-art functional and system-level test solutions to RISC-V processors. Then, we discuss the use of RISC-V processors for safety-related applications; to this end, we outline the essential techniques necessary to obtain safety both in the functional and in the timing domain and review recent processor designs with safety features. Finally, we survey the different aspects of security with respect to RISC-V implementations and discuss the relationship between cryptographic protocols and primitives on the one hand and the RISC-V processor architecture and hardware implementation on the other. We also comment on the role of a RISC-V processor for system security and its resilience against side-channel attacks.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Counterfeit Detection by Semiconductor Process Technology Inspection Semi-Supervised Deep Learning for Microcontroller Performance Screening FINaL: Driving High-Level Fault Injection Campaigns with Natural Language Learn to Tune: Robust Performance Tuning in Post-Silicon Validation A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1