用扫描电镜技术研究/spl α /-石英表面的电荷

Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) Pub Date : 1993-10-17 DOI:10.1109/CEIDP.1993.378975

H. Gong, C. Gressus, K. H. Oh, X. Ding, C. Ong, B. Tan

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引用次数: 0

摘要

测定了/spl α /-石英不同切割上捕获的电子。从SEM(扫描电子显微镜)镜像为电荷电位。观察到不同切口的充电能力不同;装药能力随切割角度的增大而减小。这种现象与极化能、缺陷密度和应力有关。

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The investigation of charging on /spl alpha/-quartz facets by a SEM technique

Electrons trapped on different cuts of /spl alpha/-quartz are determined. From an SEM (scanning electron microscope) mirror image for the charge potential. Different charging abilities for the various cuts are observed; charging ability decreases with increase of cutting angle. This phenomenon is related to polarization energy, defect density, and stresses.<>

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Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)

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