{"title":"基于专家运行经验分析的集成电路运行故障率模型选择","authors":"M. A. Artyukhova","doi":"10.31799/978-5-8088-1558-2-2021-2-211-216","DOIUrl":null,"url":null,"abstract":"Evaluation of reliability indicators is necessary procedure in the design of a technical system. The article consider two failure rate models for integrated circuits and a number of conclusions, derived from model comparison with operating experience.","PeriodicalId":297099,"journal":{"name":"The Second All-Russian Scientific Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SELECTION OF AN OPERATIONAL FAILURE RATE MODEL FOR INTEGRATED CIRCUITS BASED ON EXPERT ANALYSIS OF OPERATING EXPERIENCE\",\"authors\":\"M. A. Artyukhova\",\"doi\":\"10.31799/978-5-8088-1558-2-2021-2-211-216\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Evaluation of reliability indicators is necessary procedure in the design of a technical system. The article consider two failure rate models for integrated circuits and a number of conclusions, derived from model comparison with operating experience.\",\"PeriodicalId\":297099,\"journal\":{\"name\":\"The Second All-Russian Scientific Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-04-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Second All-Russian Scientific Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31799/978-5-8088-1558-2-2021-2-211-216\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Second All-Russian Scientific Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31799/978-5-8088-1558-2-2021-2-211-216","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
SELECTION OF AN OPERATIONAL FAILURE RATE MODEL FOR INTEGRATED CIRCUITS BASED ON EXPERT ANALYSIS OF OPERATING EXPERIENCE
Evaluation of reliability indicators is necessary procedure in the design of a technical system. The article consider two failure rate models for integrated circuits and a number of conclusions, derived from model comparison with operating experience.
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