{"title":"基于模式重叠和广播的测试模式压缩","authors":"Martin Chloupek, O. Novák","doi":"10.1109/IWECMS.2011.5952372","DOIUrl":null,"url":null,"abstract":"The high test data volume and long test application time are two major concerns for testing scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This paper will illustrate that these new techniques are effective in both the test application time and the test data volume reduction.","PeriodicalId":211450,"journal":{"name":"2011 10th International Workshop on Electronics, Control, Measurement and Signals","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2011-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Test pattern compression based on pattern overlapping and broadcasting\",\"authors\":\"Martin Chloupek, O. Novák\",\"doi\":\"10.1109/IWECMS.2011.5952372\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The high test data volume and long test application time are two major concerns for testing scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This paper will illustrate that these new techniques are effective in both the test application time and the test data volume reduction.\",\"PeriodicalId\":211450,\"journal\":{\"name\":\"2011 10th International Workshop on Electronics, Control, Measurement and Signals\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 10th International Workshop on Electronics, Control, Measurement and Signals\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWECMS.2011.5952372\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 10th International Workshop on Electronics, Control, Measurement and Signals","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWECMS.2011.5952372","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Test pattern compression based on pattern overlapping and broadcasting
The high test data volume and long test application time are two major concerns for testing scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This paper will illustrate that these new techniques are effective in both the test application time and the test data volume reduction.