E. Chowdhury, K. Kafka, Robert A. Mitchell, A. Russell, Kevin Werner, N. Talisa, Hui Li, A. Yi, D. Schumacher
{"title":"单次飞秒激光烧蚀铜:实验与模拟","authors":"E. Chowdhury, K. Kafka, Robert A. Mitchell, A. Russell, Kevin Werner, N. Talisa, Hui Li, A. Yi, D. Schumacher","doi":"10.1117/12.2195787","DOIUrl":null,"url":null,"abstract":"Single 5 and 40 femtosecond, near IR pulses with fluences varying from 0.4 – 80 J/cm2 from a Ti:Sapphire laser was focused onto a single crystal Cu sample surface with 2.0 μm focal spot at 15 and 45 degree angle of incidence. The surface profiles after interaction were studied with an interferometric depth profiler (Wyko NT9100), and benchmarked against crater size and morphology predicted by 2D Particle-In-Cell (PIC) laser damage simulation model.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Single-shot femtosecond laser ablation of copper: experiment vs. simulation\",\"authors\":\"E. Chowdhury, K. Kafka, Robert A. Mitchell, A. Russell, Kevin Werner, N. Talisa, Hui Li, A. Yi, D. Schumacher\",\"doi\":\"10.1117/12.2195787\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Single 5 and 40 femtosecond, near IR pulses with fluences varying from 0.4 – 80 J/cm2 from a Ti:Sapphire laser was focused onto a single crystal Cu sample surface with 2.0 μm focal spot at 15 and 45 degree angle of incidence. The surface profiles after interaction were studied with an interferometric depth profiler (Wyko NT9100), and benchmarked against crater size and morphology predicted by 2D Particle-In-Cell (PIC) laser damage simulation model.\",\"PeriodicalId\":204978,\"journal\":{\"name\":\"SPIE Laser Damage\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"SPIE Laser Damage\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2195787\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE Laser Damage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2195787","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single-shot femtosecond laser ablation of copper: experiment vs. simulation
Single 5 and 40 femtosecond, near IR pulses with fluences varying from 0.4 – 80 J/cm2 from a Ti:Sapphire laser was focused onto a single crystal Cu sample surface with 2.0 μm focal spot at 15 and 45 degree angle of incidence. The surface profiles after interaction were studied with an interferometric depth profiler (Wyko NT9100), and benchmarked against crater size and morphology predicted by 2D Particle-In-Cell (PIC) laser damage simulation model.