{"title":"基于RIC-LBP特征提取的数字图像拼接检测","authors":"Vikas Srivastavaven, S. Yadav","doi":"10.1109/PDGC50313.2020.9315812","DOIUrl":null,"url":null,"abstract":"In this paper, we proposed rotation invariant co-occurrence among adjacent local binary pattern (RIC-LBP) based feature extraction technique for forgery detection. We use Standard Deviation filter (STD) to highlights the image pixel variation, RIC-LBP operator for feature extraction, and Logistic Regression Classifiers (LRC) for forgery detection to know the internal statistics of the image. LRC is a machine learning technique so directly used as a classifier on the entire data set. So it differs from SVM classifier. In this proposed work, we used two datasets, Columbia and DSO-1, to evaluate our proposed work. It gives better results compare to various state of the art.","PeriodicalId":347216,"journal":{"name":"2020 Sixth International Conference on Parallel, Distributed and Grid Computing (PDGC)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Digital Image splicing Detection Using RIC-LBP Feature Extraction Technique\",\"authors\":\"Vikas Srivastavaven, S. Yadav\",\"doi\":\"10.1109/PDGC50313.2020.9315812\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we proposed rotation invariant co-occurrence among adjacent local binary pattern (RIC-LBP) based feature extraction technique for forgery detection. We use Standard Deviation filter (STD) to highlights the image pixel variation, RIC-LBP operator for feature extraction, and Logistic Regression Classifiers (LRC) for forgery detection to know the internal statistics of the image. LRC is a machine learning technique so directly used as a classifier on the entire data set. So it differs from SVM classifier. In this proposed work, we used two datasets, Columbia and DSO-1, to evaluate our proposed work. It gives better results compare to various state of the art.\",\"PeriodicalId\":347216,\"journal\":{\"name\":\"2020 Sixth International Conference on Parallel, Distributed and Grid Computing (PDGC)\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 Sixth International Conference on Parallel, Distributed and Grid Computing (PDGC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PDGC50313.2020.9315812\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Sixth International Conference on Parallel, Distributed and Grid Computing (PDGC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PDGC50313.2020.9315812","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Digital Image splicing Detection Using RIC-LBP Feature Extraction Technique
In this paper, we proposed rotation invariant co-occurrence among adjacent local binary pattern (RIC-LBP) based feature extraction technique for forgery detection. We use Standard Deviation filter (STD) to highlights the image pixel variation, RIC-LBP operator for feature extraction, and Logistic Regression Classifiers (LRC) for forgery detection to know the internal statistics of the image. LRC is a machine learning technique so directly used as a classifier on the entire data set. So it differs from SVM classifier. In this proposed work, we used two datasets, Columbia and DSO-1, to evaluate our proposed work. It gives better results compare to various state of the art.