{"title":"低能电子技术研究","authors":"Xiao-qing Yuan, Yi-kai Shi, Dang Jian-hui","doi":"10.1109/ICMET.2010.5598463","DOIUrl":null,"url":null,"abstract":"A brief general introduction to a novel low energy electron-exoelectron was given. Various emission methods of induced solid were involved. More detailed consideration was given to these following topics: classification of exoelectron emission mechanisms; emission models of exoelectron; applications of exoelectron; the appplication of metal micro-crack predicting by low energy electron technology was especially described; and finally many issues demanding prompt solution for low energy electron technology were proposed.","PeriodicalId":415118,"journal":{"name":"2010 International Conference on Mechanical and Electrical Technology","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Low energy electron technology study\",\"authors\":\"Xiao-qing Yuan, Yi-kai Shi, Dang Jian-hui\",\"doi\":\"10.1109/ICMET.2010.5598463\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A brief general introduction to a novel low energy electron-exoelectron was given. Various emission methods of induced solid were involved. More detailed consideration was given to these following topics: classification of exoelectron emission mechanisms; emission models of exoelectron; applications of exoelectron; the appplication of metal micro-crack predicting by low energy electron technology was especially described; and finally many issues demanding prompt solution for low energy electron technology were proposed.\",\"PeriodicalId\":415118,\"journal\":{\"name\":\"2010 International Conference on Mechanical and Electrical Technology\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-10-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Conference on Mechanical and Electrical Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMET.2010.5598463\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference on Mechanical and Electrical Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMET.2010.5598463","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A brief general introduction to a novel low energy electron-exoelectron was given. Various emission methods of induced solid were involved. More detailed consideration was given to these following topics: classification of exoelectron emission mechanisms; emission models of exoelectron; applications of exoelectron; the appplication of metal micro-crack predicting by low energy electron technology was especially described; and finally many issues demanding prompt solution for low energy electron technology were proposed.
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