一个500 MHz 32字X 64位8端口自复位CMOS寄存器文件和相关的动态到静态锁存器

Henkels, Joshi
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引用次数: 22

摘要

微处理器的超标量体系结构的出现产生了对具有许多端口的寄存器文件的需求。这种多移植与高密度、高性能、e和%e测试的普遍目标是不一致的。高密度多端口有利于单端读取和输出。然而,单端运算使得高性能更难实现。VLSI的另一个问题是如何测试众多的嵌入式阵列。通常,大型存储器阵列采用ABIST电路。但是,对于较小的数组,例如寄存器文件,ABIST的开销对性能和面积的影响更大,因此不太可接受。在此背景下,我们开始设计一个2写/6读端口32 x 64位寄存器文件,该文件紧凑,快速且易于在2.5 v 0.5 pm CMOS技术中进行测试。我们的方法采用自复位CMOS (SRCMOS)动态电路[1]。在输入脉冲宽度变化的情况下,特别注意确保设计的鲁棒性。测试问题已经通过使内存单元完全兼容LSSD预先处理。还设计了一个动态到静态的锁存器,它可以使寄存器文件与动态或静态数据流兼容。
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A 500 MHz 32-word X 64-bit 8-port Self-resetting CMOS Register File And Associated Dynamic-to-static Latch
The advent of superscalar architectures for microprocessors has created the need for register files having many ports. Such multi-porting is at odds with the universal goals of high-density, high-performanc,e, and %e of testing. High-density multi-porting favors single-ended reading and wnting. However, single-ended operation makes high-performance more difficult to achieve. Another issue in VLSI is how to test the numerous embedded arrays. Typically, large memory arrays employ ABIST circuiuy. However, for small arrays, such as register files, the overhead of ABIST is more significant for performance and area, and thus is less acceptable. With this background we have set out to design a 2-write/6-read-port 32 x 64-bit register file which is dense AND fast AND readily testable in a 2.5-V 0.5-pm CMOS technology. Our approach employs self-resetting CMOS (SRCMOS) dynamic circuits [I]. Special attention has been paid toward insuring design robustness with regard to input pulsewidth variations. The testing issue has been dealt with up-front by making the memory cells totally LSSD compatible. Also designed was a dynamic-to-static latch which can be employed to make the register file compatible with either a dynamic or static dataflow.
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