用于物联网节点的全动态泄漏抑制低功耗SRAM

J. Yin, M. Stan
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引用次数: 1

摘要

动态泄漏抑制(DLS)技术已经被研究用于抑制静态随机存取存储器(SRAM)单元的静态泄漏,但大多数相关工作都集中在部分电路上实现该技术,为进一步减少泄漏留下了空间。本文采用前馈DLS技术构建了低漏读缓冲器(RB)。然后将DLS RB与DLS交叉耦合逆变器集成为一个完整的DLS SRAM单元。基于商用65纳米CMOS技术的SPICE仿真表明,与相应的4T RB和4T RB相比,DLS RB和DLS SRAM电池的泄漏功率分别降低了73.96%和49.84%。此外,还提出了一种DLS“伪器件”,以优化晶体管的参数,并在漏损和性能之间进行权衡。最后,采用DLS SRAM单元的DLS SRAM阵列在最小工作电压为0.4V时实现了10.9kHz的最大工作频率,总泄漏电流为2.15nA(泄漏功率为645fW),在0.3V时放大到4kb,适用于物联网(IoT)节点的低功耗数据存储。
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A Low Power SRAM with Fully Dynamic Leakage Suppression for IoT Nodes
Dynamic leakage suppression (DLS) technique has been investigated to suppress the static leakages of static random-access memory (SRAM) cells, but most of the related works focused on implementing the technique only on part of the circuit, leaving room for further improvements to reduce leakage. In this paper, the feed-forward DLS technique is used to construct a low leakage read buffer (RB). The DLS RB is then integrated with DLS cross-coupled inverters as a full DLS SRAM cell. From SPICE simulations based on a commercial 65nm CMOS technology, the proposed DLS RB and DLS SRAM cell with the DLS RB help reduce the leakage power by 73.96% and 49.84%, respectively, compared to the corresponding 4T RB and DLS SRAM cell with the 4T RB. Additionally, a DLS "pseudo-device" is proposed to optimize parameters of transistors and the trade-off between leakage and performance. Lastly, a DLS SRAM array macro using the proposed DLS SRAM cell achieves a maximum operating frequency of 10.9kHz at the minimum operating voltage of 0.4V and a total leakage current of 2.15nA (leakage power of 645fW) scaled up to 4kb at 0.3V suitable for low power data storage at Internet of Things (IoT) nodes.
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