T. Matsushima, Nobuaki Ikehara, T. Hisakado, O. Wada
{"title":"DPI法定量LDO调压器射频传导免疫重现性的改进","authors":"T. Matsushima, Nobuaki Ikehara, T. Hisakado, O. Wada","doi":"10.1109/EMCCOMPO.2013.6735173","DOIUrl":null,"url":null,"abstract":"In this paper, we discussed the reproducibility of the direct RF power injection method. Transmission and reflection characteristics of the measurement setup affected the evaluation of immunity. Also, the common-mode generation at the connection of the DC supply cable should be reduced using the common-mode absorption devices.","PeriodicalId":302757,"journal":{"name":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"428 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Improvement of reproducibility of DPI method to quantify RF conducted immunity of LDO regulator\",\"authors\":\"T. Matsushima, Nobuaki Ikehara, T. Hisakado, O. Wada\",\"doi\":\"10.1109/EMCCOMPO.2013.6735173\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we discussed the reproducibility of the direct RF power injection method. Transmission and reflection characteristics of the measurement setup affected the evaluation of immunity. Also, the common-mode generation at the connection of the DC supply cable should be reduced using the common-mode absorption devices.\",\"PeriodicalId\":302757,\"journal\":{\"name\":\"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"volume\":\"428 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCCOMPO.2013.6735173\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2013.6735173","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improvement of reproducibility of DPI method to quantify RF conducted immunity of LDO regulator
In this paper, we discussed the reproducibility of the direct RF power injection method. Transmission and reflection characteristics of the measurement setup affected the evaluation of immunity. Also, the common-mode generation at the connection of the DC supply cable should be reduced using the common-mode absorption devices.