采用先进互连技术的CSP和bga封装柔性成型及可靠性研究的最新进展

F. Ansorge, K. Becker, R. Ehrlich, G. Azdasht, V. Bader, R. Aschenbrenner, H. Reichl
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引用次数: 0

摘要

在半导体产业的发展过程中,几乎整个封装领域都转移到了远东地区。只有少数包装商留在欧洲,专注于大规模生产。在德国柏林的Fraunhofer IZM,设计了一条塑料包装线,用于快速,灵活和高质量的低规模包装和原型设计服务。该生产线由一个环氧多芯片贴片机、焊丝贴片机、倒装芯片贴片系统、多柱塞成型系统、激光打标/修边站、引线成型和引线焊接组成。对于倒装芯片和球栅阵列(BGA)封装的焊球放置,使用激光焊球放置机。本机可放置和同时回流各种材料和直径的焊锡球。安装了IZM模具和装配线,为工业提供中小型生产。这个中心也可以用于包开发。在本文中,最近的应用,如机电一体化和多芯片倒装芯片工艺的组合在不同的载体,包括封装成型。对于csp和tape-BGA的生产,采用光纤推进连接法作为关键技术。所有的包装都要经过详细的可靠性调查。本文重点研究了下填料和模塑化合物的湿敏性。介绍了芯片级封装和小芯片微bgas的加速老化试验结果和失效机理。讨论了加工条件和材料选择和设计的改进,以实现在汽车使用的恶劣环境条件下具有高可靠性的包装。
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Recent progress in flexible moulding and reliability investigation of CSP and BGA-packages using advanced interconnection technology
During semiconductor industry development, almost the whole packaging segment has shifted to the far east. Only a few packagers remained in Europe, focused on large scale production. At the Fraunhofer IZM, Berlin, Germany, a plastic packaging line was designed for fast, flexible and qualified service in low scale packaging and prototyping. The line consists of an epoxy multi-chip die bonder, wire bonder, flip chip placement system, multi-plunger moulding system, laser marking/trimming station, lead forming and lead soldering. For solder ball placement of both flip chips and ball grid array (BGA) packages, a laser solder ball placer is used. This machine can place and simultaneously reflow solder balls of various materials and diameters. The IZM mould and assembly line was installed to offer small/medium sized production to industry. This center can also be used for package development. In this paper, recent applications such as mechatronics and combination of multichip flip chip processes on different carriers including encapsulation by moulding are demonstrated. For production of CSPs and tape-BGA, the fiber-push connection method was used as a key technology. All packages are subject to detailed reliability investigations. The paper focuses on the moisture sensitivity of underfill and moulding compounds. Results of accelerated aging tests and the failure mechanisms for chip scale packages and few-chip micro-BGAs are demonstrated. Improvements for processing conditions and material selection and design are discussed, in order to achieve packages with high reliability for harsh environmental conditions in automotive use.
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