{"title":"图像欧氏距离的快速算法","authors":"Bing Sun, Jufu Feng","doi":"10.1109/CCPR.2008.32","DOIUrl":null,"url":null,"abstract":"Determining, or selecting a distance measure over the input feature space is a fundamental problem in pattern recognition. A notable metric, called the image euclidean distance (IMED) was proposed by Wang et al. [5], which is demonstrated consistent performance improvements in many real-world problems. In this paper, we present a fast implementation of IMED, which is referred as the convolution standardizing transform (CST). It can reduce the space complexity from O(n<sub>1</sub> <sup>2</sup>n<sub>2</sub> <sup>2</sup> ) to O(1) , and the time complexity from O(n<sub>1</sub> <sup>2</sup>n<sub>2</sub> <sup>2</sup> ) to O(n<sub>1</sub>n<sub>2</sub>), for n<sub>1</sub> X n<sub>2</sub> images. Both theoretical analysis and experimental results show the efficiency of our algorithm.","PeriodicalId":292956,"journal":{"name":"2008 Chinese Conference on Pattern Recognition","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A Fast Algorithm for Image Euclidean Distance\",\"authors\":\"Bing Sun, Jufu Feng\",\"doi\":\"10.1109/CCPR.2008.32\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Determining, or selecting a distance measure over the input feature space is a fundamental problem in pattern recognition. A notable metric, called the image euclidean distance (IMED) was proposed by Wang et al. [5], which is demonstrated consistent performance improvements in many real-world problems. In this paper, we present a fast implementation of IMED, which is referred as the convolution standardizing transform (CST). It can reduce the space complexity from O(n<sub>1</sub> <sup>2</sup>n<sub>2</sub> <sup>2</sup> ) to O(1) , and the time complexity from O(n<sub>1</sub> <sup>2</sup>n<sub>2</sub> <sup>2</sup> ) to O(n<sub>1</sub>n<sub>2</sub>), for n<sub>1</sub> X n<sub>2</sub> images. Both theoretical analysis and experimental results show the efficiency of our algorithm.\",\"PeriodicalId\":292956,\"journal\":{\"name\":\"2008 Chinese Conference on Pattern Recognition\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 Chinese Conference on Pattern Recognition\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCPR.2008.32\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Chinese Conference on Pattern Recognition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCPR.2008.32","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Determining, or selecting a distance measure over the input feature space is a fundamental problem in pattern recognition. A notable metric, called the image euclidean distance (IMED) was proposed by Wang et al. [5], which is demonstrated consistent performance improvements in many real-world problems. In this paper, we present a fast implementation of IMED, which is referred as the convolution standardizing transform (CST). It can reduce the space complexity from O(n12n22 ) to O(1) , and the time complexity from O(n12n22 ) to O(n1n2), for n1 X n2 images. Both theoretical analysis and experimental results show the efficiency of our algorithm.