Genetic Analysis of Triple Pistil Wheat Derived F2 Populations to Enhance Genetic Yield Potential

Triple pistil (TP) wheat is a novel genetic resource which holds the ability to produce three grains in a single floret. In this research, TP wheat derived two F2 populations were studied to investigate genetic variability, heritability, genetic advance, genetic correlation, inheritance pattern and potential of TP trait for grain yield improvement. Phenological data were recorded for 12 morpho-agronomic traits. Most of the traits exhibited significant genetic variability (P ≤ 0.05) for further trait improvement. Strong positive genetic correlations (r ≥ 0.99 at P ≤ 0.01) were computed within yield contributing and yield limiting traits, indicating common genes controlling these traits and opportunity for simultaneous improvement. Inheritance analysis indicated double dominant (15:1) and double recessive (9:7) epistatic ratios in investigated populations, proposing that TP trait was controlled by two nuclear epistatic genes. In conclusion, TP wheat is a valuable germplasm resource for grain yield improvement and floral development studies.