保存“通过”在A.N.A.校准

A. Ferrero, U. Pisani, F. Sanpietro
{"title":"保存“通过”在A.N.A.校准","authors":"A. Ferrero, U. Pisani, F. Sanpietro","doi":"10.1109/ARFTG.1992.327007","DOIUrl":null,"url":null,"abstract":"The conventional network analyzer (NWA) two-port calibration procedures require a standard thru line to be connected between the ports. Unfortunately in many applications, for example when measuring MMIC or on-wafer devices with not aligned ports, a custom thru line must be used. The procedure here applied overcomes the difficulty due to the poor knowledge of this thru element since it is based on a generic reciprocal unknown two port structure, provided that its S21 phase shift is roughly known. Some experimental comparisons with other well sound calibration techniques will be here presented where different reciprocal two-port structures were used as unknown thru.","PeriodicalId":130939,"journal":{"name":"40th ARFTG Conference Digest","volume":"376 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Save The \\\"Thru\\\" in the A.N.A. Calibration\",\"authors\":\"A. Ferrero, U. Pisani, F. Sanpietro\",\"doi\":\"10.1109/ARFTG.1992.327007\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The conventional network analyzer (NWA) two-port calibration procedures require a standard thru line to be connected between the ports. Unfortunately in many applications, for example when measuring MMIC or on-wafer devices with not aligned ports, a custom thru line must be used. The procedure here applied overcomes the difficulty due to the poor knowledge of this thru element since it is based on a generic reciprocal unknown two port structure, provided that its S21 phase shift is roughly known. Some experimental comparisons with other well sound calibration techniques will be here presented where different reciprocal two-port structures were used as unknown thru.\",\"PeriodicalId\":130939,\"journal\":{\"name\":\"40th ARFTG Conference Digest\",\"volume\":\"376 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"40th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1992.327007\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"40th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1992.327007","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

传统的网络分析仪(NWA)双端口校准程序需要在端口之间连接标准直通线。不幸的是,在许多应用中,例如当测量端口未对齐的MMIC或晶圆上器件时,必须使用自定义直通线。这里应用的程序克服了由于对该贯穿元件知之甚少而造成的困难,因为它是基于一般的互易未知的两端口结构,只要它的S21相移大致已知。这里将介绍一些与其他井声校准技术的实验比较,其中使用不同的倒数双端口结构作为未知通道。
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Save The "Thru" in the A.N.A. Calibration
The conventional network analyzer (NWA) two-port calibration procedures require a standard thru line to be connected between the ports. Unfortunately in many applications, for example when measuring MMIC or on-wafer devices with not aligned ports, a custom thru line must be used. The procedure here applied overcomes the difficulty due to the poor knowledge of this thru element since it is based on a generic reciprocal unknown two port structure, provided that its S21 phase shift is roughly known. Some experimental comparisons with other well sound calibration techniques will be here presented where different reciprocal two-port structures were used as unknown thru.
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