{"title":"一种利用热成像技术进行电路故障诊断的系统","authors":"L. G. Allred, G. E. Kelly","doi":"10.1109/AUTEST.1992.270076","DOIUrl":null,"url":null,"abstract":"In many instances, the electronic state of an electronic circuit card contains insufficient information for correct fault diagnosis. Infrared thermal images, captured during the initial warmup of an electronic circuit card, are employed to enhance the available information and to assist the technician in performing the fault diagnosis. This system has proven beneficial for radar and microwave technologies where probing changes the electronic response of the circuit and signal levels can be extremely small. The development of this system has required the integration of technologies from a diversity of fields including image capture, image compression, image enhancement, neural networks, genetic algorithms, thermodynamics, and automatic test equipment (ATE) software. These technologies and preliminary system performance are discussed.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":"{\"title\":\"A system for fault diagnosis in electronic circuits using thermal imaging\",\"authors\":\"L. G. Allred, G. E. Kelly\",\"doi\":\"10.1109/AUTEST.1992.270076\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In many instances, the electronic state of an electronic circuit card contains insufficient information for correct fault diagnosis. Infrared thermal images, captured during the initial warmup of an electronic circuit card, are employed to enhance the available information and to assist the technician in performing the fault diagnosis. This system has proven beneficial for radar and microwave technologies where probing changes the electronic response of the circuit and signal levels can be extremely small. The development of this system has required the integration of technologies from a diversity of fields including image capture, image compression, image enhancement, neural networks, genetic algorithms, thermodynamics, and automatic test equipment (ATE) software. These technologies and preliminary system performance are discussed.<<ETX>>\",\"PeriodicalId\":273287,\"journal\":{\"name\":\"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-09-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1992.270076\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1992.270076","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A system for fault diagnosis in electronic circuits using thermal imaging
In many instances, the electronic state of an electronic circuit card contains insufficient information for correct fault diagnosis. Infrared thermal images, captured during the initial warmup of an electronic circuit card, are employed to enhance the available information and to assist the technician in performing the fault diagnosis. This system has proven beneficial for radar and microwave technologies where probing changes the electronic response of the circuit and signal levels can be extremely small. The development of this system has required the integration of technologies from a diversity of fields including image capture, image compression, image enhancement, neural networks, genetic algorithms, thermodynamics, and automatic test equipment (ATE) software. These technologies and preliminary system performance are discussed.<>