一种基于数字相位的决策反馈均衡器动态补偿方法

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Circuits Devices & Systems Pub Date : 2021-03-21 DOI:10.1049/cds2.12027
Andres Amaya, Javier Ardila, Elkim Roa
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引用次数: 0

摘要

介绍了一种降低决策反馈均衡器中作为采样器的动态比较器偏置电压的低复杂度方法。作者提出了相域偏移减小技术(PORT),该技术利用输出数据的全数字相位估计进行偏移补偿,而无需将比较器输入设置为共模电压(VCM)。虽然传统技术可能会破坏偏移调整的数据链路,但所提出的技术允许实时校准比较器。测量从一个26db损耗的片上仿真通道与芯片示波器能力验证端口通过眼图在采样器输入。在台积电130 nm 1.2 V制程中实现了原型,实验结果表明将PORT扩展到最先进的技术节点以实现多千兆运行的可能性。
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A digital phase-based on-fly offset compensation method for decision feedback equalisers

A low-complexity method to reduce the offset voltage of dynamic comparators employed as samplers in decision feedback equalisers (DFE) is introduced. The authors propose the phase-domain offset reduction technique (PORT), which leverages an all-digital phase estimation of output data for offset compensation, without setting the comparator input to a common-mode voltage (VCM). While traditional techniques might break the data link for offset adjustment, the proposed technique allows calibrating the comparator on-the-fly. Measurements from a 26-dB-loss on-chip emulated channel with chip-scope capability validates PORT through eye-diagrams at sampler input. A prototype was implemented in a TSMC 130 nm 1.2 V process, and experimental results show the possibility of extending PORT to state-of-the-art technology nodes for multi-gigabit operation.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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