基于软件生命周期的嵌入式软件可靠性预测

Ting Dong, Hui Shi, Yajie Zhu, Kai Li, Fengping Chai, Yan Wang
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引用次数: 1

摘要

为了保证嵌入式软件的质量,基于软件生命周期,提出了基于BP神经网络的软件可靠性预测方法。首先分析影响软件可靠性的各种因素,然后根据相关标准和工程实践选择影响软件可靠性的度量。收集实际项目中的软件可靠性测量数据,利用建立的软件可靠性预测模型对软件模块缺陷进行预测,并将预测结果与实际结果进行对比。对比结果表明,该模型能够有效地预测软件模块缺陷的数量,有效地指出软件单元测试工作的测试关键模块。
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Embedded Software Reliability Prediction Based on Software Life Cycle
In order to guarantee the quality of embedded software, based on the software life cycle, a BP neural network is proposed to predict the software reliability. First analyze the various factors that affect the reliability of the software, and then select the metrics that affect the reliability of the software based on relevant standards and engineering practices. The software reliability measurement data in the actual project was collected, and the established software reliability prediction model is used to predict the software module defects, and the prediction results are compared with the real results. The comparison results show that the model can effectively predict the number of software module defects and effectively indicate the test key module for the software unit test work.
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