{"title":"x波段无损裂纹检测","authors":"P. Das, S. B. Belamgi, S. Ray","doi":"10.1109/ICECI.2014.6767371","DOIUrl":null,"url":null,"abstract":"Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.","PeriodicalId":315219,"journal":{"name":"International Conference on Electronics, Communication and Instrumentation (ICECI)","volume":"88 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Non destructive crack detection at X-band\",\"authors\":\"P. Das, S. B. Belamgi, S. Ray\",\"doi\":\"10.1109/ICECI.2014.6767371\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.\",\"PeriodicalId\":315219,\"journal\":{\"name\":\"International Conference on Electronics, Communication and Instrumentation (ICECI)\",\"volume\":\"88 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-03-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Electronics, Communication and Instrumentation (ICECI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECI.2014.6767371\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Electronics, Communication and Instrumentation (ICECI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECI.2014.6767371","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
