H. Shi, F. Yuan, F. Sha, J. Drewniak, T. Hubing, T. van Doren
{"title":"多层PCB直流电源母线解耦仿真与测量","authors":"H. Shi, F. Yuan, F. Sha, J. Drewniak, T. Hubing, T. van Doren","doi":"10.1109/ISEMC.1996.561273","DOIUrl":null,"url":null,"abstract":"DC power bus decoupling of a multi-layer PCB is modeled by a combination of a lumped circuit model at low frequencies (<200 MHz), and a mixed-potential integral equation approach at high frequencies. In order to determine the lumped parameters of via interconnects, an effective procedure using a network analyzer has been developed to characterize the trace/via inductances/resistances. For an 8\"/spl times/10\" ten-layer test board used in this study, the simulations show good agreement with the measurement. This method can lead to new design strategies of decoupling for multilayer PCB power buses.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Simulation and measurement for decoupling on multilayer PCB DC power buses\",\"authors\":\"H. Shi, F. Yuan, F. Sha, J. Drewniak, T. Hubing, T. van Doren\",\"doi\":\"10.1109/ISEMC.1996.561273\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"DC power bus decoupling of a multi-layer PCB is modeled by a combination of a lumped circuit model at low frequencies (<200 MHz), and a mixed-potential integral equation approach at high frequencies. In order to determine the lumped parameters of via interconnects, an effective procedure using a network analyzer has been developed to characterize the trace/via inductances/resistances. For an 8\\\"/spl times/10\\\" ten-layer test board used in this study, the simulations show good agreement with the measurement. This method can lead to new design strategies of decoupling for multilayer PCB power buses.\",\"PeriodicalId\":296175,\"journal\":{\"name\":\"Proceedings of Symposium on Electromagnetic Compatibility\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-08-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1996.561273\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1996.561273","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation and measurement for decoupling on multilayer PCB DC power buses
DC power bus decoupling of a multi-layer PCB is modeled by a combination of a lumped circuit model at low frequencies (<200 MHz), and a mixed-potential integral equation approach at high frequencies. In order to determine the lumped parameters of via interconnects, an effective procedure using a network analyzer has been developed to characterize the trace/via inductances/resistances. For an 8"/spl times/10" ten-layer test board used in this study, the simulations show good agreement with the measurement. This method can lead to new design strategies of decoupling for multilayer PCB power buses.