带扫描FFs的电气互连测试阈值估计

IEEE CPMT Symposium Japan 2014 Pub Date : 2014-11-01 DOI:10.1109/ICSJ.2014.7009634

Kousuke Nambara, Shoichi Umezu, H. Yotsuyanagi, M. Hashizume, Shyue-Kung Lu

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引用次数: 1

摘要

提出了一种用于检测三维集成电路中模具间互连处开放缺陷的电气互连测试阈值的估计方法，并通过该估计方法导出了由我们的原型集成电路在印刷电路板上制成的电路的阈值。结果表明，该方法可以用估计的阈值检测出阻值大于16.1Ω的阻性开放缺陷。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Threshold value estimation of electrical interconnect tests with scan FFs

An estimation method of a threshold value for electrical interconnect tests is proposed for detecting open defects at interconnects between dies in a 3D IC. Threshold values of a circuit made of our prototyping IC on a printed circuit board are derived by the estimation method. The results show us that resistive open defects whose resistance is larger than 16.1Ω can be detected with a threshold value estimated by the method.

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IEEE CPMT Symposium Japan 2014

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