使用多个线性反馈移位寄存器进行低功耗扫描测试的确定性内置自检

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI:10.1109/ATS.2009.50

Lung-Jen Lee, W. Tseng, Rung-Bin Lin, Chi-Wei Yu

{"title":"使用多个线性反馈移位寄存器进行低功耗扫描测试的确定性内置自检","authors":"Lung-Jen Lee, W. Tseng, Rung-Bin Lin, Chi-Wei Yu","doi":"10.1109/ATS.2009.50","DOIUrl":null,"url":null,"abstract":"Large test data volume and excessive testing power are two strict challenges for VLSI testing. This paper presents a deterministic BIST using multiple LFSRs to generate the low power test set. Experimental results show, the two problems, especially in the reduction of testing power, can be significantly improved with limited hardware overhead.","PeriodicalId":106283,"journal":{"name":"2009 Asian Test Symposium","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing\",\"authors\":\"Lung-Jen Lee, W. Tseng, Rung-Bin Lin, Chi-Wei Yu\",\"doi\":\"10.1109/ATS.2009.50\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Large test data volume and excessive testing power are two strict challenges for VLSI testing. This paper presents a deterministic BIST using multiple LFSRs to generate the low power test set. Experimental results show, the two problems, especially in the reduction of testing power, can be significantly improved with limited hardware overhead.\",\"PeriodicalId\":106283,\"journal\":{\"name\":\"2009 Asian Test Symposium\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 Asian Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2009.50\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2009.50","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 5

摘要

庞大的测试数据量和过高的测试功率是VLSI测试面临的两大严峻挑战。本文提出了一种使用多个lfsr生成低功耗测试集的确定性BIST。实验结果表明，在有限的硬件开销下，这两个问题都可以得到显著改善，尤其是在降低测试功耗方面。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing

Large test data volume and excessive testing power are two strict challenges for VLSI testing. This paper presents a deterministic BIST using multiple LFSRs to generate the low power test set. Experimental results show, the two problems, especially in the reduction of testing power, can be significantly improved with limited hardware overhead.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2009 Asian Test Symposium

自引率

0.00%

发文量

期刊最新文献

Self-Calibrating Embedded RF Down-Conversion Mixers On Improving Diagnostic Test Generation for Scan Chain Failures A Post-Silicon Debug Support Using High-Level Design Description New Class of Tests for Open Faults with Considering Adjacent Lines Scan Compression Implementation in Industrial Design - Case Study