{"title":"ATS 2019组织联合主席致辞","authors":"I. Sengupta","doi":"10.1109/ats47505.2019.00008","DOIUrl":null,"url":null,"abstract":"Over the past three decades, ATS has grown to be one of the most significant international forums in the area of testing and diagnosis of circuits, systems and software. It is an honour for us to lead the organization of this conference this year. ATS 2019 continues the tradition of a very competitive review process, high-quality technical papers, stimulating and in-depth tutorials, and a wide variety of industry forum presentations.","PeriodicalId":258824,"journal":{"name":"2019 IEEE 28th Asian Test Symposium (ATS)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Message from the ATS 2019 Organizing Co-Chairs\",\"authors\":\"I. Sengupta\",\"doi\":\"10.1109/ats47505.2019.00008\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Over the past three decades, ATS has grown to be one of the most significant international forums in the area of testing and diagnosis of circuits, systems and software. It is an honour for us to lead the organization of this conference this year. ATS 2019 continues the tradition of a very competitive review process, high-quality technical papers, stimulating and in-depth tutorials, and a wide variety of industry forum presentations.\",\"PeriodicalId\":258824,\"journal\":{\"name\":\"2019 IEEE 28th Asian Test Symposium (ATS)\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 28th Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ats47505.2019.00008\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 28th Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ats47505.2019.00008","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Over the past three decades, ATS has grown to be one of the most significant international forums in the area of testing and diagnosis of circuits, systems and software. It is an honour for us to lead the organization of this conference this year. ATS 2019 continues the tradition of a very competitive review process, high-quality technical papers, stimulating and in-depth tutorials, and a wide variety of industry forum presentations.
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