实时高通量微流控液滴分选的时间分辨荧光测量系统

W. Khaddour, W. Uhring, F. Dadouche, V. Frick, M. Madec
{"title":"实时高通量微流控液滴分选的时间分辨荧光测量系统","authors":"W. Khaddour, W. Uhring, F. Dadouche, V. Frick, M. Madec","doi":"10.1109/newcas49341.2020.9159813","DOIUrl":null,"url":null,"abstract":"This work presents a Fluorescence Life-Time (FLT) measurement system for real-time microfluidic droplet sorting in high throughput conditions. This system is implemented using a low cost System-on-Chip (SoC) Field-Programmable Gate Array (FPGA) platform, that combines a Cyclone V FPGA with a dual-core ARM Cortex-a9 Hard Processor System (HPS). A time-correlated single photon counting system is implemented in the FPGA part and the data are transferred to the SDRAM of the HPS part to be processed by a developed bare-metal C program to extract the FLT of each droplet passing through the detection spot. According to the droplet's measured FLT, an action could be taken to sort this droplet. The system automatically detects the droplets and extracts their FLT values at different simulated droplet flow rates; from a few droplets up to 1 thousand droplets per second. Thanks to the use of a maximum Likelihood-based algorithm, the standard deviation of the measured FLTs of simulated droplets of the same material is only 30% above the theoretical quantum photon shot noise limit.","PeriodicalId":135163,"journal":{"name":"2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Time-Resolved fluorescence measurement system for real-time high-throughput microfluidic droplet sorting\",\"authors\":\"W. Khaddour, W. Uhring, F. Dadouche, V. Frick, M. Madec\",\"doi\":\"10.1109/newcas49341.2020.9159813\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a Fluorescence Life-Time (FLT) measurement system for real-time microfluidic droplet sorting in high throughput conditions. This system is implemented using a low cost System-on-Chip (SoC) Field-Programmable Gate Array (FPGA) platform, that combines a Cyclone V FPGA with a dual-core ARM Cortex-a9 Hard Processor System (HPS). A time-correlated single photon counting system is implemented in the FPGA part and the data are transferred to the SDRAM of the HPS part to be processed by a developed bare-metal C program to extract the FLT of each droplet passing through the detection spot. According to the droplet's measured FLT, an action could be taken to sort this droplet. The system automatically detects the droplets and extracts their FLT values at different simulated droplet flow rates; from a few droplets up to 1 thousand droplets per second. Thanks to the use of a maximum Likelihood-based algorithm, the standard deviation of the measured FLTs of simulated droplets of the same material is only 30% above the theoretical quantum photon shot noise limit.\",\"PeriodicalId\":135163,\"journal\":{\"name\":\"2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/newcas49341.2020.9159813\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/newcas49341.2020.9159813","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本工作提出了一种在高通量条件下实时微流控液滴分选的荧光寿命(FLT)测量系统。该系统采用低成本的片上系统(SoC)现场可编程门阵列(FPGA)平台实现,该平台结合了Cyclone V FPGA和双核ARM Cortex-a9硬处理器系统(HPS)。FPGA部分实现了时间相关单光子计数系统,将数据传输到HPS部分的SDRAM中,由开发的裸机C程序进行处理,提取通过检测点的每个液滴的FLT。根据测量到的液滴的FLT,可以采取措施对液滴进行分类。系统自动检测液滴并提取不同模拟液滴流速下的FLT值;从几滴到每秒1000滴。由于使用了基于极大似然的算法,相同材料的模拟液滴的测量FLTs的标准偏差仅比理论量子光子散粒噪声极限高30%。
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Time-Resolved fluorescence measurement system for real-time high-throughput microfluidic droplet sorting
This work presents a Fluorescence Life-Time (FLT) measurement system for real-time microfluidic droplet sorting in high throughput conditions. This system is implemented using a low cost System-on-Chip (SoC) Field-Programmable Gate Array (FPGA) platform, that combines a Cyclone V FPGA with a dual-core ARM Cortex-a9 Hard Processor System (HPS). A time-correlated single photon counting system is implemented in the FPGA part and the data are transferred to the SDRAM of the HPS part to be processed by a developed bare-metal C program to extract the FLT of each droplet passing through the detection spot. According to the droplet's measured FLT, an action could be taken to sort this droplet. The system automatically detects the droplets and extracts their FLT values at different simulated droplet flow rates; from a few droplets up to 1 thousand droplets per second. Thanks to the use of a maximum Likelihood-based algorithm, the standard deviation of the measured FLTs of simulated droplets of the same material is only 30% above the theoretical quantum photon shot noise limit.
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