用于锁相环应用的高速CMOS电荷泵电路采用90nm CMOS技术

Jyoti Gupta, A. Sangal, Hemlata Verma
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引用次数: 16

摘要

电荷泵的性能在很大程度上取决于能否有效地在芯片上产生高电压,同时满足严格的功率和面积要求。本文提出了一种用于锁相环应用的高速CMOS电荷泵电路,该电路采用90nm CMOS技术,工作电压为1V。该电路具有简单的对称结构,在减少杂散跳变现象的同时提供了更稳定的工作。实验结果表明,该方法在克服抖动问题方面有明显的改善。本设计可将输出电压提高到1010mV。在1000兆赫的工作频率下对电荷泵的功能进行了测试。
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High speed CMOS charge pump circuit for PLL applications using 90nm CMOS technology
The performance of charge pumps depends heavily on the ability to efficiently generate high voltages on-chip while meeting stringent power and area requirements. The paper presents a High Speed CMOS charge pump circuit for PLL applications using 90nm CMOS technology that operates at 1V. The proposed circuit has simple symmetric structure and provides more stable operation while reducing spurious jump phenomenon. The experimental result shows significant improvement in overcoming the problem of jitter. The output voltage of presented design can be increased up to 1010mV. The functionality of charge pump has been tested at operating based frequency of 1000 MHz.
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