扫描激光显微镜对CdS: Mn量子点的研究

2007 ICTON Mediterranean Winter Conference Pub Date : 2007-12-01 DOI:10.1109/ICTONMW.2007.4446918

S. Stanciu, R. Hristu, B. Savu, G. Stanciu, D. Mohanta, G. A. Ahmed, A. Choudhury

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引用次数: 0

摘要

本文研究了掺杂剂对量子点光致发光光谱的影响，并利用共聚焦光谱激光扫描显微镜(CSLM)研究了薄膜内的CdS:Mn纳米粒子。另一方面，利用4倍频显微镜对半导体量子点的非线性光学特性(如三次谐波产生)进行了研究，揭示了半导体量子点的非线性行为及其在光子器件开发中的应用前景。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Investigation on CdS: Mn quantum dots using scanning laser microscopy

This paper investigates the effect of the dopant on the photoluminescent spectrum of quantum dots and we used a confocal spectral laser scanning microscope (CSLM) to investigate CdS:Mn nanoparticles within thin films. On the other hand study regarding nonlinear optical properties such as third harmonic generation (THG) was done using the 4pi microscope to reveal the nonlinear behavior of semiconductor quantum dots and their possible use in the development of photonic devices.

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2007 ICTON Mediterranean Winter Conference

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