{"title":"在NGTG过程中使用商业建模和仿真工具","authors":"M.L. Lynch","doi":"10.1109/AUTEST.1997.633584","DOIUrl":null,"url":null,"abstract":"Next Generation Test Generator (NGTG) processes require the existence of circuit models, both good and faulty, as well as the simulation of these models in order to develop tests in an effective manner. This paper addresses the issues associated with model development and simulation within an NGTG framework. The emphasis of the model development and simulation methods is on the use of commercial tools. If test automation processes are to be successfully used throughout the design and test community, the tools that designers are familiar with and use everyday must be incorporated into the NGTG processes. This paper describes the overall system briefly and the functional elements related to model development in detail. The model development portion of the system is composed of three basic functional elements: Netlist Generator (NG), Component Model Library (CML) and Automatic Model Builder (AMB). The simulation of the models is an integral part of the Automatic Test Generation (ATG) system and is presented in detail. A circuit model development process is described which allows for the creation of the good circuit model as well as the fault models necessary as part of the ATG systems. The model development and simulation approach emphasizes the use of commercial tools such as OrCAD(R)'s Capture/sup TM/, Simucad's SILOS(R) III and Intusoft/sup TM/'s ICAP/4.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Using commercial modeling and simulation tools within NGTG processes\",\"authors\":\"M.L. Lynch\",\"doi\":\"10.1109/AUTEST.1997.633584\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Next Generation Test Generator (NGTG) processes require the existence of circuit models, both good and faulty, as well as the simulation of these models in order to develop tests in an effective manner. This paper addresses the issues associated with model development and simulation within an NGTG framework. The emphasis of the model development and simulation methods is on the use of commercial tools. If test automation processes are to be successfully used throughout the design and test community, the tools that designers are familiar with and use everyday must be incorporated into the NGTG processes. This paper describes the overall system briefly and the functional elements related to model development in detail. The model development portion of the system is composed of three basic functional elements: Netlist Generator (NG), Component Model Library (CML) and Automatic Model Builder (AMB). The simulation of the models is an integral part of the Automatic Test Generation (ATG) system and is presented in detail. A circuit model development process is described which allows for the creation of the good circuit model as well as the fault models necessary as part of the ATG systems. 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Using commercial modeling and simulation tools within NGTG processes
Next Generation Test Generator (NGTG) processes require the existence of circuit models, both good and faulty, as well as the simulation of these models in order to develop tests in an effective manner. This paper addresses the issues associated with model development and simulation within an NGTG framework. The emphasis of the model development and simulation methods is on the use of commercial tools. If test automation processes are to be successfully used throughout the design and test community, the tools that designers are familiar with and use everyday must be incorporated into the NGTG processes. This paper describes the overall system briefly and the functional elements related to model development in detail. The model development portion of the system is composed of three basic functional elements: Netlist Generator (NG), Component Model Library (CML) and Automatic Model Builder (AMB). The simulation of the models is an integral part of the Automatic Test Generation (ATG) system and is presented in detail. A circuit model development process is described which allows for the creation of the good circuit model as well as the fault models necessary as part of the ATG systems. The model development and simulation approach emphasizes the use of commercial tools such as OrCAD(R)'s Capture/sup TM/, Simucad's SILOS(R) III and Intusoft/sup TM/'s ICAP/4.