一种用于火灾探测的全mos混合模拟数字电路

D. Barbier, R. Poujois, J. Borel
{"title":"一种用于火灾探测的全mos混合模拟数字电路","authors":"D. Barbier, R. Poujois, J. Borel","doi":"10.1109/ESSCIRC.1980.5468783","DOIUrl":null,"url":null,"abstract":"MOS technology allows to make on the same chip analog and digital functions provided the analog functions can be realized in standard technology. This is the case for an all-MOS P channel Al gate fire detector chip where temperature rise or smoke density rise (signal from an ionization chamber) provide an alarm signal. Maximum values of these parameters are also detected. Self testing on chip is made for indicating a malfunctioning of the chip.","PeriodicalId":168272,"journal":{"name":"ESSCIRC 80: 6th European Solid State Circuits Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An All-MOS Mixed Analog and Digital Circuit for Fire Detection\",\"authors\":\"D. Barbier, R. Poujois, J. Borel\",\"doi\":\"10.1109/ESSCIRC.1980.5468783\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"MOS technology allows to make on the same chip analog and digital functions provided the analog functions can be realized in standard technology. This is the case for an all-MOS P channel Al gate fire detector chip where temperature rise or smoke density rise (signal from an ionization chamber) provide an alarm signal. Maximum values of these parameters are also detected. Self testing on chip is made for indicating a malfunctioning of the chip.\",\"PeriodicalId\":168272,\"journal\":{\"name\":\"ESSCIRC 80: 6th European Solid State Circuits Conference\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1980-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC 80: 6th European Solid State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.1980.5468783\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC 80: 6th European Solid State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.1980.5468783","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

MOS技术允许在同一芯片上实现模拟和数字功能,只要模拟功能可以在标准技术中实现。这是全mos P通道铝门火灾探测器芯片的情况,其中温度上升或烟雾密度上升(来自电离室的信号)提供报警信号。这些参数的最大值也被检测。芯片上的自检用于指示芯片的故障。
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An All-MOS Mixed Analog and Digital Circuit for Fire Detection
MOS technology allows to make on the same chip analog and digital functions provided the analog functions can be realized in standard technology. This is the case for an all-MOS P channel Al gate fire detector chip where temperature rise or smoke density rise (signal from an ionization chamber) provide an alarm signal. Maximum values of these parameters are also detected. Self testing on chip is made for indicating a malfunctioning of the chip.
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