散点擦洗:一种减少FPGA组态存储器中SEU修复时间的方法

M. Mousavi, H. Pourshaghaghi, H. Corporaal, Akash Kumar
{"title":"散点擦洗:一种减少FPGA组态存储器中SEU修复时间的方法","authors":"M. Mousavi, H. Pourshaghaghi, H. Corporaal, Akash Kumar","doi":"10.1109/DFT.2019.8875431","DOIUrl":null,"url":null,"abstract":"SRAM-based FPGAs are widely used in many critical systems in which dependability is an essential factor. However, SRAM-based FPGAs are sensitive to Single Event Upsets (SEUs), especially when they are used in space. Scrubbing is an effective technique to protect FPGA Configuration Memory (CM) against SEUs. One major hurdle in read-back scrubbing techniques is that they suffer from long Mean Time To Repair (MTTR). In this paper, we propose scatter scrubbing, a new method that reduces MTTR by exploiting the locality of SEUs sensitive bits in CM. It is based on 1) splitting FPGA CM into several partitions based on how critical the CM bits are for proper operation of the FPGA circuit, and 2) deriving a smart schedule for scrubbing the partitions. Finding an optimal partition and scheduling has non-polynomial complexity; therefore we rely on clever heuristics, especially for the first step. However, for small designs, we developed an accelerated brute-force method giving the optimal solution, which we can use as a reference. The experimental results show, for real FPGA designs, up to 64% reduction in MTTR compared to state-of-the-art techniques.","PeriodicalId":415648,"journal":{"name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"154 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Scatter Scrubbing: A Method to Reduce SEU Repair Time in FPGA Configuration Memory\",\"authors\":\"M. Mousavi, H. Pourshaghaghi, H. Corporaal, Akash Kumar\",\"doi\":\"10.1109/DFT.2019.8875431\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"SRAM-based FPGAs are widely used in many critical systems in which dependability is an essential factor. However, SRAM-based FPGAs are sensitive to Single Event Upsets (SEUs), especially when they are used in space. Scrubbing is an effective technique to protect FPGA Configuration Memory (CM) against SEUs. One major hurdle in read-back scrubbing techniques is that they suffer from long Mean Time To Repair (MTTR). In this paper, we propose scatter scrubbing, a new method that reduces MTTR by exploiting the locality of SEUs sensitive bits in CM. It is based on 1) splitting FPGA CM into several partitions based on how critical the CM bits are for proper operation of the FPGA circuit, and 2) deriving a smart schedule for scrubbing the partitions. Finding an optimal partition and scheduling has non-polynomial complexity; therefore we rely on clever heuristics, especially for the first step. However, for small designs, we developed an accelerated brute-force method giving the optimal solution, which we can use as a reference. The experimental results show, for real FPGA designs, up to 64% reduction in MTTR compared to state-of-the-art techniques.\",\"PeriodicalId\":415648,\"journal\":{\"name\":\"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"volume\":\"154 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2019.8875431\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2019.8875431","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

基于sram的fpga广泛应用于许多关键系统中,可靠性是关键因素。然而,基于sram的fpga对单事件干扰(seu)很敏感,特别是当它们在太空中使用时。擦洗是保护FPGA配置内存(CM)不受seu干扰的有效技术。回读清除技术的一个主要障碍是它们的平均修复时间(MTTR)很长。在本文中,我们提出了一种新的方法,即散射擦洗,它利用了CM中SEUs敏感位的局域性来降低MTTR。它的基础是:1)根据CM位对FPGA电路的正确操作有多重要,将FPGA CM划分为几个分区;2)推导一个智能调度来清理这些分区。寻找最优分区和调度具有非多项式复杂度;因此,我们依靠聪明的启发式,特别是在第一步。然而,对于小型设计,我们开发了一种加速蛮力方法,给出了最优解,可以作为参考。实验结果表明,对于实际的FPGA设计,与最先进的技术相比,MTTR降低了64%。
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Scatter Scrubbing: A Method to Reduce SEU Repair Time in FPGA Configuration Memory
SRAM-based FPGAs are widely used in many critical systems in which dependability is an essential factor. However, SRAM-based FPGAs are sensitive to Single Event Upsets (SEUs), especially when they are used in space. Scrubbing is an effective technique to protect FPGA Configuration Memory (CM) against SEUs. One major hurdle in read-back scrubbing techniques is that they suffer from long Mean Time To Repair (MTTR). In this paper, we propose scatter scrubbing, a new method that reduces MTTR by exploiting the locality of SEUs sensitive bits in CM. It is based on 1) splitting FPGA CM into several partitions based on how critical the CM bits are for proper operation of the FPGA circuit, and 2) deriving a smart schedule for scrubbing the partitions. Finding an optimal partition and scheduling has non-polynomial complexity; therefore we rely on clever heuristics, especially for the first step. However, for small designs, we developed an accelerated brute-force method giving the optimal solution, which we can use as a reference. The experimental results show, for real FPGA designs, up to 64% reduction in MTTR compared to state-of-the-art techniques.
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