通过V/sub DD/和V/sub TH/控制降低CMOS VLSI的功耗

T. Sakurai
{"title":"通过V/sub DD/和V/sub TH/控制降低CMOS VLSI的功耗","authors":"T. Sakurai","doi":"10.1109/ISQED.2000.838910","DOIUrl":null,"url":null,"abstract":"Lowering operating voltage, V/sub DD/, is a key to low-power CMOS digital VLSIs. In order to complete a certain task in a required time and in order to keep leakage current within a tolerable level in the low V/sub DD/ designs, V/sub DD/ and V/sub TH/ control is obligatory. This paper covers several of the schemes including multi-V/sub TH/, variable V/sub TH/, multi-V/sub DD/ and variable V/sub DD/ to achieve low-power systems. Circuit level ideas for software related research are described.","PeriodicalId":113766,"journal":{"name":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Reducing power consumption of CMOS VLSI's through V/sub DD/ and V/sub TH/ control\",\"authors\":\"T. Sakurai\",\"doi\":\"10.1109/ISQED.2000.838910\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Lowering operating voltage, V/sub DD/, is a key to low-power CMOS digital VLSIs. In order to complete a certain task in a required time and in order to keep leakage current within a tolerable level in the low V/sub DD/ designs, V/sub DD/ and V/sub TH/ control is obligatory. This paper covers several of the schemes including multi-V/sub TH/, variable V/sub TH/, multi-V/sub DD/ and variable V/sub DD/ to achieve low-power systems. Circuit level ideas for software related research are described.\",\"PeriodicalId\":113766,\"journal\":{\"name\":\"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-03-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2000.838910\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2000.838910","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

降低工作电压V/sub DD/是实现低功耗CMOS数字vlsi的关键。在低V/sub DD/设计中,为了在规定的时间内完成一定的任务并使漏电流保持在可容忍的水平,必须控制V/sub DD/和V/sub TH/。本文介绍了几种实现低功耗系统的方案,包括多V/sub TH/、可变V/sub TH/、多V/sub DD/和可变V/sub DD/。描述了软件相关研究的电路级思想。
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Reducing power consumption of CMOS VLSI's through V/sub DD/ and V/sub TH/ control
Lowering operating voltage, V/sub DD/, is a key to low-power CMOS digital VLSIs. In order to complete a certain task in a required time and in order to keep leakage current within a tolerable level in the low V/sub DD/ designs, V/sub DD/ and V/sub TH/ control is obligatory. This paper covers several of the schemes including multi-V/sub TH/, variable V/sub TH/, multi-V/sub DD/ and variable V/sub DD/ to achieve low-power systems. Circuit level ideas for software related research are described.
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