{"title":"COTS IBM 64M DRAM在空间中的适用性","authors":"A. Fox, W. Abare, A. Ross","doi":"10.1109/RADECS.1997.698899","DOIUrl":null,"url":null,"abstract":"This paper provides results of total dose and heavy ion testing of the IBM 0165400 DRAM, and discusses the architectural impacts of using these parts in a solid state digital recorder in a LEO orbit.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Suitability of COTS IBM 64M DRAM in space\",\"authors\":\"A. Fox, W. Abare, A. Ross\",\"doi\":\"10.1109/RADECS.1997.698899\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper provides results of total dose and heavy ion testing of the IBM 0165400 DRAM, and discusses the architectural impacts of using these parts in a solid state digital recorder in a LEO orbit.\",\"PeriodicalId\":106774,\"journal\":{\"name\":\"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-09-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.1997.698899\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1997.698899","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper provides results of total dose and heavy ion testing of the IBM 0165400 DRAM, and discusses the architectural impacts of using these parts in a solid state digital recorder in a LEO orbit.