{"title":"用于全自检电路的强码分离CMOS内置中压传感器的设计与实现","authors":"Joseph C. W. Pang, M. Wong, Yim-Shu Lee","doi":"10.1109/ATS.1997.643925","DOIUrl":null,"url":null,"abstract":"This paper presents a new approach to implement a strongly code-disjoint CMOS built-in intermediate voltage sensor(BIVS). The function of the BIVS is used to detect any intermediate voltage caused by bridging and transistor stuck-on faults in the circuit. Detailed analyses of the proposed circuit have shown that the overall design not only can detect fault in the circuit under test, but also can detect or tolerate the fault in itself. An application example employing the BIVS as the output detection element to enhance the effectiveness of the totally selfchecking circuit is given.","PeriodicalId":330767,"journal":{"name":"Proceedings Sixth Asian Test Symposium (ATS'97)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Design and implementation of strongly code disjoint CMOS built-in intermediate voltage sensor for totally self-checking circuits\",\"authors\":\"Joseph C. W. Pang, M. Wong, Yim-Shu Lee\",\"doi\":\"10.1109/ATS.1997.643925\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new approach to implement a strongly code-disjoint CMOS built-in intermediate voltage sensor(BIVS). The function of the BIVS is used to detect any intermediate voltage caused by bridging and transistor stuck-on faults in the circuit. Detailed analyses of the proposed circuit have shown that the overall design not only can detect fault in the circuit under test, but also can detect or tolerate the fault in itself. An application example employing the BIVS as the output detection element to enhance the effectiveness of the totally selfchecking circuit is given.\",\"PeriodicalId\":330767,\"journal\":{\"name\":\"Proceedings Sixth Asian Test Symposium (ATS'97)\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Sixth Asian Test Symposium (ATS'97)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1997.643925\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Sixth Asian Test Symposium (ATS'97)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1997.643925","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design and implementation of strongly code disjoint CMOS built-in intermediate voltage sensor for totally self-checking circuits
This paper presents a new approach to implement a strongly code-disjoint CMOS built-in intermediate voltage sensor(BIVS). The function of the BIVS is used to detect any intermediate voltage caused by bridging and transistor stuck-on faults in the circuit. Detailed analyses of the proposed circuit have shown that the overall design not only can detect fault in the circuit under test, but also can detect or tolerate the fault in itself. An application example employing the BIVS as the output detection element to enhance the effectiveness of the totally selfchecking circuit is given.