W. Filali, S. Oussalah, N. Sengouga, M. Henini, David Taylor
{"title":"基于钛/金肖特基触点Al0.29Ga0.71As的p型肖特基二极管仿真","authors":"W. Filali, S. Oussalah, N. Sengouga, M. Henini, David Taylor","doi":"10.1109/ICM.2018.8704017","DOIUrl":null,"url":null,"abstract":"This paper presents a systematic simulation approach for analyzing a p-type Ti/Au/Al0.29Ga0.71 As Schottky diode with traps. The traps parameters are extracted by DLTS (Deep Level Transient Spectroscopy) technique. Simulation was carried out using Atlas-SILVACO TCAD 2D simulator. The simulation is performed using the appropriate physical models to explain the behavior of the physical mechanisms of the Schottky diode. The obtained results are the current-voltage and capacitance-voltage characteristic as function of temperature, frequency and Schottky contact diameters with and without defects.","PeriodicalId":305356,"journal":{"name":"2018 30th International Conference on Microelectronics (ICM)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Simulation of p-type Schottky Diode Based on Al0.29Ga0.71As with Titanium/Gold Schottky Contact\",\"authors\":\"W. Filali, S. Oussalah, N. Sengouga, M. Henini, David Taylor\",\"doi\":\"10.1109/ICM.2018.8704017\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a systematic simulation approach for analyzing a p-type Ti/Au/Al0.29Ga0.71 As Schottky diode with traps. The traps parameters are extracted by DLTS (Deep Level Transient Spectroscopy) technique. Simulation was carried out using Atlas-SILVACO TCAD 2D simulator. The simulation is performed using the appropriate physical models to explain the behavior of the physical mechanisms of the Schottky diode. The obtained results are the current-voltage and capacitance-voltage characteristic as function of temperature, frequency and Schottky contact diameters with and without defects.\",\"PeriodicalId\":305356,\"journal\":{\"name\":\"2018 30th International Conference on Microelectronics (ICM)\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 30th International Conference on Microelectronics (ICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2018.8704017\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 30th International Conference on Microelectronics (ICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2018.8704017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation of p-type Schottky Diode Based on Al0.29Ga0.71As with Titanium/Gold Schottky Contact
This paper presents a systematic simulation approach for analyzing a p-type Ti/Au/Al0.29Ga0.71 As Schottky diode with traps. The traps parameters are extracted by DLTS (Deep Level Transient Spectroscopy) technique. Simulation was carried out using Atlas-SILVACO TCAD 2D simulator. The simulation is performed using the appropriate physical models to explain the behavior of the physical mechanisms of the Schottky diode. The obtained results are the current-voltage and capacitance-voltage characteristic as function of temperature, frequency and Schottky contact diameters with and without defects.
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