基于香料和载流子输运的晶闸管等离子体扩散模拟的比较

R. Quintero, A. Cerdeira
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引用次数: 2

摘要

在平行于晶闸管和其他四层器件电极的XZ平面上的瞬态电流密度分布令人感兴趣。由于基于载流子输运方程(包括XZ平面)的数值模拟必须以3D形式进行,因此它们将变得既耗时又昂贵。文献中报道的基于香料的XZ模拟器要快得多,但结果强烈依赖于所使用的必要的简单等效电路。本文比较了用XZ spice模拟器在晶闸管中进行的等离子体扩散模拟,以及基于载流子输运方程的2D-XY模拟。研究发现,对于模拟结构,等离子体扩散速度在瞬态开始时偏离+38%,在瞬态结束时偏离-32%。另一方面,对于XZ模拟,假设阳极电流垂直于XZ平面,因此,离散元件的数量取决于该假设的有效性程度。从XY模拟可以证实,电流流动几乎平行于Y方向,使得高度的XZ离散化成为可能。
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A comparison of Spice-based and carrier transport based simulations of plasma spread in thyristors
The transient current density distribution in the plane XZ parallel to the electrodes of thyristors and other 4-layer devices is of interest. Since numerical simulations based on the carrier transport equations that include the XZ plane would have to be carried out in 3D, they would become time consuming and expensive. Spice-based XZ simulators as reported in literature are much faster, but the results depend strongly on the necessarily simple equivalent circuits that are used. This paper compares plasma spread simulations in a thyristor, done with an XZ Spice-based simulator previously reported by the authors, with 2D-XY simulations based on the carrier transport equations. It found that for the simulated structure, plasma spread velocity deviates +38% at the beginning of the transient, and -32% near the end of it. On the other hand, for the XZ simulations, it is assumed that the anode current is perpendicular to the XZ plane, and, therefore, the number of discrete elements depend on the extent of validity of that assumption. From the XY simulations it is confirmed that the current flow is almost parallel to the Y direction, making possible high degrees of XZ discretizations.
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