{"title":"电磁兼容抗扰度仿真自动验证","authors":"B. Vrignon, P. Caunegre, J. Shepherd, Jianfei Wu","doi":"10.1109/EMCCOMPO.2013.6735201","DOIUrl":null,"url":null,"abstract":"Immunity of analog circuit blocks is becoming a major design risk. This paper presents an automated methodology to simulate the susceptibility of a circuit during the design phase. More specifically, we propose a CAD tool which determines the fail/pass criteria of a signal under direct power injection (DPI). This contribution describes the function of the tool which is validated by a LDO regulator.","PeriodicalId":302757,"journal":{"name":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"198200 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Automatic verification of EMC immunity by simulation\",\"authors\":\"B. Vrignon, P. Caunegre, J. Shepherd, Jianfei Wu\",\"doi\":\"10.1109/EMCCOMPO.2013.6735201\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Immunity of analog circuit blocks is becoming a major design risk. This paper presents an automated methodology to simulate the susceptibility of a circuit during the design phase. More specifically, we propose a CAD tool which determines the fail/pass criteria of a signal under direct power injection (DPI). This contribution describes the function of the tool which is validated by a LDO regulator.\",\"PeriodicalId\":302757,\"journal\":{\"name\":\"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"volume\":\"198200 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCCOMPO.2013.6735201\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2013.6735201","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automatic verification of EMC immunity by simulation
Immunity of analog circuit blocks is becoming a major design risk. This paper presents an automated methodology to simulate the susceptibility of a circuit during the design phase. More specifically, we propose a CAD tool which determines the fail/pass criteria of a signal under direct power injection (DPI). This contribution describes the function of the tool which is validated by a LDO regulator.