{"title":"测试晶圆规模阵列:多重故障下的恒定可测试性","authors":"D. Sciuto, F. Lombardi","doi":"10.1109/ICWSI.1990.63908","DOIUrl":null,"url":null,"abstract":"Deals with the testing of one-dimensional arrays in a complexity independent of array size (C-testability). The first aspect of C-testability analyzed in this paper, is a new model for the internal organization of a basic cell under a restricted fault assumption. This paper also presents a new approach for multiple fault detection of one-dimensional (linear) arrays.<<ETX>>","PeriodicalId":206140,"journal":{"name":"1990 Proceedings. International Conference on Wafer Scale Integration","volume":"85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Testing wafer scale arrays: constant testability under multiple faults\",\"authors\":\"D. Sciuto, F. Lombardi\",\"doi\":\"10.1109/ICWSI.1990.63908\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Deals with the testing of one-dimensional arrays in a complexity independent of array size (C-testability). The first aspect of C-testability analyzed in this paper, is a new model for the internal organization of a basic cell under a restricted fault assumption. This paper also presents a new approach for multiple fault detection of one-dimensional (linear) arrays.<<ETX>>\",\"PeriodicalId\":206140,\"journal\":{\"name\":\"1990 Proceedings. International Conference on Wafer Scale Integration\",\"volume\":\"85 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-01-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1990 Proceedings. International Conference on Wafer Scale Integration\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICWSI.1990.63908\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 Proceedings. International Conference on Wafer Scale Integration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICWSI.1990.63908","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Testing wafer scale arrays: constant testability under multiple faults
Deals with the testing of one-dimensional arrays in a complexity independent of array size (C-testability). The first aspect of C-testability analyzed in this paper, is a new model for the internal organization of a basic cell under a restricted fault assumption. This paper also presents a new approach for multiple fault detection of one-dimensional (linear) arrays.<>
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