双光谱比光电器件主要参数测试技术的发展

2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices Pub Date : 2015-08-13 DOI:10.1109/EDM.2015.7184555

N. Tupikina, E. Sypin, S. Lisakov, A. Pavlov, G. V. Leonov

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引用次数: 10

摘要

本文介绍了两种光谱比光电子器件主要技术参数的测定方法。介绍了响应时间、角场、温度检测阈值和决策有效性的测试技术。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Development of testing technique of main parameters for two spectral ratios optical-electronic device

The techniques for determining of the main technical parameters of the two spectral ratios optical-electronic device are shown in the article. The testing technique for response time, angular field, temperature detection threshold and validity of decision-making are described.

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2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices

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