{"title":"用蒙特卡罗模拟方法研究绝缘体的二次电子发射","authors":"J. Ganachaud, A. Mokrani","doi":"10.1109/CEIDP.1993.378967","DOIUrl":null,"url":null,"abstract":"A Monte-Carlo simulation model has been constructed to describe the secondary electron emission of insulator targets. It accounts for the different electron insulator elementary processes. Other aspects relevant to recent developments in the field of space charge physics (distribution of polaron trapping sites, field distribution, etc.) are also included. The conclusions obtained by this method are in good agreement with experimental observations. The study suggests that a realistic simulation model, including elastic effects, the existence of defects and polaron trapping sites and the effect of the electrostatic field, is necessary in order to account for the measured values of the secondary yield in an insulator target like alumina.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"11 2","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Study of the secondary electron emission of insulators by a Monte-Carlo simulation method\",\"authors\":\"J. Ganachaud, A. Mokrani\",\"doi\":\"10.1109/CEIDP.1993.378967\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A Monte-Carlo simulation model has been constructed to describe the secondary electron emission of insulator targets. It accounts for the different electron insulator elementary processes. Other aspects relevant to recent developments in the field of space charge physics (distribution of polaron trapping sites, field distribution, etc.) are also included. The conclusions obtained by this method are in good agreement with experimental observations. The study suggests that a realistic simulation model, including elastic effects, the existence of defects and polaron trapping sites and the effect of the electrostatic field, is necessary in order to account for the measured values of the secondary yield in an insulator target like alumina.<<ETX>>\",\"PeriodicalId\":149803,\"journal\":{\"name\":\"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)\",\"volume\":\"11 2\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1993.378967\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1993.378967","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Study of the secondary electron emission of insulators by a Monte-Carlo simulation method
A Monte-Carlo simulation model has been constructed to describe the secondary electron emission of insulator targets. It accounts for the different electron insulator elementary processes. Other aspects relevant to recent developments in the field of space charge physics (distribution of polaron trapping sites, field distribution, etc.) are also included. The conclusions obtained by this method are in good agreement with experimental observations. The study suggests that a realistic simulation model, including elastic effects, the existence of defects and polaron trapping sites and the effect of the electrostatic field, is necessary in order to account for the measured values of the secondary yield in an insulator target like alumina.<>