非对称异质结构半导体激光器折射率反导结构的研究

Yue Zhang, Te Li, Rong Chen, Yuzhi Wang, Guojun Liu, E. Hao
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引用次数: 0

摘要

对波长为808 nm的100μm宽幅GaAs/AlGaAs量子阱半导体激光器的非对称反导向层进行了理论分析和计算。选取有源区(含量子阱和波导)中反导层al含量的三种情况,分别计算和分析了光约束因子、阈值电流、最大输出功率和垂直光束发散角对反导层厚度的依赖关系。结果表明,当反导层厚度一定时,al含量越高,对器件性能的影响越大;当反导层中al含量一定时,随着反导层厚度的增加,对器件性能的影响增大。
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Investigation of refractive index antiguiding structure for asymmetric heterostructure semiconductor laser
Anti-guiding layers of asymmetric heterostructure for 100μm-wide-strip GaAs/AlGaAs quantum-well semiconductor lasers emitting at a wavelength of 808 nm are analyzed and calculated theoretically. Choosing three cases of Al-content of antiguiding layer in the active region [containing quantum well (QW) and waveguides], we calculate and analyze the dependences of optical confinement factor, threshold current, maximal output power and vertical beam divergence angle on the thickness of the antiguiding layer, separately. According to the results, when the thickness of antiguiding layer is constant, the higher the Al-content is the greater on performance of device is; when the Al-content in antiguiding layer is constant, the effect on performance of device enlarged with the increase of thickness of antiguiding layer.
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