{"title":"电磁兼容测试程序中物理测量分析和测量不确定度的确定过程","authors":"E. Bronaugh, J. Osburn","doi":"10.1109/ISEMC.1996.561237","DOIUrl":null,"url":null,"abstract":"The coming application of uncertainty to EMC measurements is described, and the terms are defined. Concepts of accuracy and precision are translated to uncertainties, and the impact on EMC measurements and the interpretation of results are described. The development of actual uncertainties for EMC measurements is explained and suggestions for improving uncertainties are included.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"A process for the analysis of the physics of measurement and determination of measurement uncertainty in EMC test procedures\",\"authors\":\"E. Bronaugh, J. Osburn\",\"doi\":\"10.1109/ISEMC.1996.561237\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The coming application of uncertainty to EMC measurements is described, and the terms are defined. Concepts of accuracy and precision are translated to uncertainties, and the impact on EMC measurements and the interpretation of results are described. The development of actual uncertainties for EMC measurements is explained and suggestions for improving uncertainties are included.\",\"PeriodicalId\":296175,\"journal\":{\"name\":\"Proceedings of Symposium on Electromagnetic Compatibility\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-08-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1996.561237\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1996.561237","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A process for the analysis of the physics of measurement and determination of measurement uncertainty in EMC test procedures
The coming application of uncertainty to EMC measurements is described, and the terms are defined. Concepts of accuracy and precision are translated to uncertainties, and the impact on EMC measurements and the interpretation of results are described. The development of actual uncertainties for EMC measurements is explained and suggestions for improving uncertainties are included.
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