{"title":"超出标准热噪声限制的噪声测量","authors":"E. Ivanov, M. Tobar","doi":"10.1109/FREQ.2008.4622960","DOIUrl":null,"url":null,"abstract":"We demonstrated the possibility of \"real time\" noise measurements at microwave frequencies with spectral resolution ~ 8 dB below the standard thermal noise limit. This was achieved by combining the principles of microwave circuit interferometry with signal recycling and minimizing the influence of various technical noise sources on the measurement processes.","PeriodicalId":220442,"journal":{"name":"2008 IEEE International Frequency Control Symposium","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Noise measurements beyond the standard thermal noise limit\",\"authors\":\"E. Ivanov, M. Tobar\",\"doi\":\"10.1109/FREQ.2008.4622960\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrated the possibility of \\\"real time\\\" noise measurements at microwave frequencies with spectral resolution ~ 8 dB below the standard thermal noise limit. This was achieved by combining the principles of microwave circuit interferometry with signal recycling and minimizing the influence of various technical noise sources on the measurement processes.\",\"PeriodicalId\":220442,\"journal\":{\"name\":\"2008 IEEE International Frequency Control Symposium\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-05-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Frequency Control Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FREQ.2008.4622960\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Frequency Control Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.2008.4622960","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Noise measurements beyond the standard thermal noise limit
We demonstrated the possibility of "real time" noise measurements at microwave frequencies with spectral resolution ~ 8 dB below the standard thermal noise limit. This was achieved by combining the principles of microwave circuit interferometry with signal recycling and minimizing the influence of various technical noise sources on the measurement processes.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
